The interface of directly bonded Si crystals studied by synchrotron X-ray diffraction

M. Nielsen, M. Poulsen, C. Kumpf, R. Feidenhans'l, P. Howes, S. Weichelt, F. Grey

    Research output: Chapter in Book/Report/Conference proceedingConference abstract in proceedingsResearch

    Original languageEnglish
    Title of host publicationProgramme and abstracts
    Place of PublicationGrenoble
    PublisherEuropean Synchrotron Radiation Facility
    Publication date2000
    Publication statusPublished - 2000
    EventSurface science 2000: Self-organization at interfaces and in thin films - Grenoble, France
    Duration: 11 Feb 200012 Feb 2000

    Conference

    ConferenceSurface science 2000: Self-organization at interfaces and in thin films
    CountryFrance
    CityGrenoble
    Period11/02/200012/02/2000

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