The interface of directly bonded Si crystals studied by synchrotron X-ray diffraction

M. Nielsen, M. Poulsen, C. Kumpf, R. Feidenhans'l, P. Howes, S. Weichelt, F. Grey

Research output: Chapter in Book/Report/Conference proceeding › Conference abstract in proceedings › Research

Original language	English
Title of host publication	Programme and abstracts
Place of Publication	Grenoble
Publisher	European Synchrotron Radiation Facility
Publication date	2000
Publication status	Published - 2000
Event	Surface science 2000: Self-organization at interfaces and in thin films - Grenoble, France Duration: 11 Feb 2000 → 12 Feb 2000

Conference	Surface science 2000: Self-organization at interfaces and in thin films
Country/Territory	France
City	Grenoble
Period	11/02/2000 → 12/02/2000

OpenUrl availability

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title = "The interface of directly bonded Si crystals studied by synchrotron X-ray diffraction",

keywords = "Nye funktionelle materialer",

author = "M. Nielsen and M. Poulsen and C. Kumpf and R. Feidenhans'l and P. Howes and S. Weichelt and F. Grey",

year = "2000",

language = "English",

booktitle = "Programme and abstracts",

publisher = "European Synchrotron Radiation Facility",

note = "Surface science 2000: Self-organization at interfaces and in thin films ; Conference date: 11-02-2000 Through 12-02-2000",

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TY - ABST

T1 - The interface of directly bonded Si crystals studied by synchrotron X-ray diffraction

AU - Nielsen, M.

AU - Poulsen, M.

AU - Kumpf, C.

AU - Feidenhans'l, R.

AU - Howes, P.

AU - Weichelt, S.

AU - Grey, F.

PY - 2000

Y1 - 2000

KW - Nye funktionelle materialer

M3 - Conference abstract in proceedings

BT - Programme and abstracts

PB - European Synchrotron Radiation Facility

CY - Grenoble

T2 - Surface science 2000: Self-organization at interfaces and in thin films

Y2 - 11 February 2000 through 12 February 2000

ER -