The impact of external optical feedback on the degradation behavior of high-power diode lasers

Martin Hempel, Mingjun Chi, Paul Michael Petersen, Ute Zeimer, Markus Weyers, Jens W. Tomm

Research output: Contribution to journalConference articleResearchpeer-review

Abstract

The impact of external feedback on high-power diode laser degradation is studied. For this purpose early stages of gradual degradation are prepared by accelerated aging of 808-nm-emitting AlGaAs-based devices. While the quantum well that actually experiences the highest total optical load remains unaffected, severe impact is observed to the cladding layers and the waveguide. Consequently hardening of diode lasers for operation under external optical feedback must necessarily involve claddings and waveguide, into which the quantum well is embedded.
Original languageEnglish
JournalProceedings of SPIE, the International Society for Optical Engineering
Volume8605
Pages (from-to)86050L
ISSN0277-786X
DOIs
Publication statusPublished - 2013
EventSPIE Photonics West : High-Power Diode Laser Technology and Applications XI - San Francisco, California, United States
Duration: 2 Feb 20137 Feb 2013

Conference

ConferenceSPIE Photonics West : High-Power Diode Laser Technology and Applications XI
CountryUnited States
CitySan Francisco, California
Period02/02/201307/02/2013

Keywords

  • Aluminum gallium arsenide
  • Feedback
  • Reliability
  • Semiconductor quantum wells
  • Waveguides
  • Semiconductor lasers

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