The Huber concept in device modeling, circuit diagnosis and |design centering

John W. Bandler; Radek M. Biernacki; Steve H. Chen; Ron H. Hemmers; Kaj Madsen

The Huber concept in device modeling, circuit diagnosis and |design centering

John W. Bandler
, Radek M. Biernacki
, Steve H. Chen
, Ron H. Hemmers
, Kaj Madsen

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review

Abstract

We present exciting applications of the Huber concept in circuit modeling and optimization. By combining the desirable properties of the l1 and l2 norms, the Huber function is robust against gross errors and smooth w.r.t. small variations in the data. We extend the Huber concept by introducing a one-sided Huber function tailored to design optimization with upper and lower specifications. We demonstrate the advantages of Huber optimization in the presence of faults, large and small measurement errors, bad starting points and statistical uncertainties. Circuit applications include parameter identification, design optimization, statistical modeling, analog fault location and yield optimization

Original language	English
Title of host publication	IEEE Int. Symp. Circuits and Systems
Publication date	1994
Pages	129-132
Publication status	Published - 1994
Event	IEEE Int. Symp. Circuits and Systems - Duration: 1 Jan 1994 → …

Conference

Conference	IEEE Int. Symp. Circuits and Systems
Period	01/01/1994 → …

Keywords

engineering design
robust estimation

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title = "The Huber concept in device modeling, circuit diagnosis and |design centering",

abstract = "We present exciting applications of the Huber concept in circuit modeling and optimization. By combining the desirable properties of the l1 and l2 norms, the Huber function is robust against gross errors and smooth w.r.t. small variations in the data. We extend the Huber concept by introducing a one-sided Huber function tailored to design optimization with upper and lower specifications. We demonstrate the advantages of Huber optimization in the presence of faults, large and small measurement errors, bad starting points and statistical uncertainties. Circuit applications include parameter identification, design optimization, statistical modeling, analog fault location and yield optimization",

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note = "IEEE Int. Symp. Circuits and Systems ; Conference date: 01-01-1994",

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AU - Chen, Steve H.

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AU - Madsen, Kaj

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N2 - We present exciting applications of the Huber concept in circuit modeling and optimization. By combining the desirable properties of the l1 and l2 norms, the Huber function is robust against gross errors and smooth w.r.t. small variations in the data. We extend the Huber concept by introducing a one-sided Huber function tailored to design optimization with upper and lower specifications. We demonstrate the advantages of Huber optimization in the presence of faults, large and small measurement errors, bad starting points and statistical uncertainties. Circuit applications include parameter identification, design optimization, statistical modeling, analog fault location and yield optimization

AB - We present exciting applications of the Huber concept in circuit modeling and optimization. By combining the desirable properties of the l1 and l2 norms, the Huber function is robust against gross errors and smooth w.r.t. small variations in the data. We extend the Huber concept by introducing a one-sided Huber function tailored to design optimization with upper and lower specifications. We demonstrate the advantages of Huber optimization in the presence of faults, large and small measurement errors, bad starting points and statistical uncertainties. Circuit applications include parameter identification, design optimization, statistical modeling, analog fault location and yield optimization

KW - engineering design

KW - robust estimation

M3 - Article in proceedings

SP - 129

EP - 132

BT - IEEE Int. Symp. Circuits and Systems

T2 - IEEE Int. Symp. Circuits and Systems

Y2 - 1 January 1994

ER -

The Huber concept in device modeling, circuit diagnosis and |design centering

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Keywords

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