The Huber concept in device modeling, circuit diagnosis and |design centering

John W. Bandler, Radek M. Biernacki, Steve H. Chen, Ron H. Hemmers, Kaj Madsen

    Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review


    We present exciting applications of the Huber concept in circuit modeling and optimization. By combining the desirable properties of the l1 and l2 norms, the Huber function is robust against gross errors and smooth w.r.t. small variations in the data. We extend the Huber concept by introducing a one-sided Huber function tailored to design optimization with upper and lower specifications. We demonstrate the advantages of Huber optimization in the presence of faults, large and small measurement errors, bad starting points and statistical uncertainties. Circuit applications include parameter identification, design optimization, statistical modeling, analog fault location and yield optimization
    Original languageEnglish
    Title of host publicationIEEE Int. Symp. Circuits and Systems
    Publication date1994
    Publication statusPublished - 1994
    EventIEEE Int. Symp. Circuits and Systems -
    Duration: 1 Jan 1994 → …


    ConferenceIEEE Int. Symp. Circuits and Systems
    Period01/01/1994 → …


    • engineering design
    • robust estimation


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