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The free-field correction of laboratory standard microphones

  • Salvador Barrera Figueroa
  • , Knud Rasmussen
  • , Finn Jacobsen

    Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

    Abstract

    The free-field sensitivity of a microphone is related to the product of its pressure sensitivity, the scattering factor, and the load of the radiation impedance on the diaphragm. The product of the last two factors is called the free-field correction and describes how much the sensitivity of the microphone differs from its pressure sensitivity. By definition the free-field sensitivity implies a plane wave impinging on the microphone. However, in practice the free-field reciprocity technique is based on the substitution of the microphones by point sources with a given diffraction factor. At sufficient distances spherical waves approximate plane waves, but this may not be the case when the microphones are calibrated using the reciprocity technique where the microphones are usually quite close to each other because of the very poor signal-to-noise ratio. An analysis of the resulting deviations is required for determining an accurate estimate of the microphone sensitivity. The problem has been analysed numerically. The numerical results are complemented with experimental data.
    Original languageEnglish
    Title of host publication12th International Congress on Sound and Vibration 2005, ICSV 2005
    Volume4
    Publication date2005
    Pages2878-2885
    ISBN (Print)978-162748149-6
    Publication statusPublished - 2005
    Event12th International Congress on Sound and Vibration - Lisbon, Portugal
    Duration: 11 Jul 200514 Jul 2005
    Conference number: 12

    Conference

    Conference12th International Congress on Sound and Vibration
    Number12
    Country/TerritoryPortugal
    CityLisbon
    Period11/07/200514/07/2005

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