The Focused Ion Beam – Scanning Electron Microscope

A tool for sample preparation, two and three dimensional imaging

Research output: Non-textual formSound/Visual production (digital)Research

136 Downloads (Pure)
Original languageEnglish
Publication date2015
Media of outputPowerPoint
Publication statusPublished - 2015
EventDTU Energy Conversion 2nd International PhD Summer School: IMAGINE: Methods in Imaging of Energy Material Microstructure - Toruplund Conference Center, Hundested, Denmark
Duration: 25 Aug 201429 Aug 2014
Conference number: 2

Course

CourseDTU Energy Conversion 2nd International PhD Summer School
Number2
LocationToruplund Conference Center
CountryDenmark
CityHundested
Period25/08/201429/08/2014

Cite this

@misc{0a3d4dcf6b4e4554b44b238d6180a33d,
title = "The Focused Ion Beam – Scanning Electron Microscope: A tool for sample preparation, two and three dimensional imaging",
author = "Bowen, {Jacob R.}",
year = "2015",
language = "English",

}

The Focused Ion Beam – Scanning Electron Microscope : A tool for sample preparation, two and three dimensional imaging . Bowen, Jacob R. (Author). 2015. Event: DTU Energy Conversion 2nd International PhD Summer School, Toruplund Conference Center, Hundested, Denmark.

Research output: Non-textual formSound/Visual production (digital)Research

TY - ADVS

T1 - The Focused Ion Beam – Scanning Electron Microscope

T2 - A tool for sample preparation, two and three dimensional imaging

A2 - Bowen, Jacob R.

PY - 2015

Y1 - 2015

M3 - Sound/Visual production (digital)

ER -