The extension of ID11 for nanoscale and hierarchical characterization

G.B.M. Vaughan, J.P. Wright, A. Bytchkov, C. Curfs, C. Gundlach, M. Orlova, L. Erra, H. Gleyzolle, T. Buslaps, A. Götz, G. Suchet, S. Petitdemange, M. Rossat, L. Margulies, W. Ludwig, A. Snigirev, I. Snigireva, Søren Schmidt, Henning Osholm Sørensen, Erik Mejdal LauridsenUlrik Lund Olsen, Jette Oddershede, Henning Friis Poulsen

    Research output: Contribution to journalConference articleResearchpeer-review

    Original languageEnglish
    JournalProceedings of the Risø International Symposium on Materials Science
    Volume31
    Pages (from-to)457-476
    ISSN0907-0079
    Publication statusPublished - 2010
    Event31st Risø International Symposium on Materials Science : Challenges in materials science and possibilities in 3D and 4D characterization techniques - Risø DTU, Roskilde, Denmark
    Duration: 6 Sep 201010 Sep 2010

    Conference

    Conference31st Risø International Symposium on Materials Science : Challenges in materials science and possibilities in 3D and 4D characterization techniques
    LocationRisø DTU
    CountryDenmark
    CityRoskilde
    Period06/09/201010/09/2010

    Keywords

    • Materials characterization and modelling
    • Materials and energy storage

    Cite this

    Vaughan, G. B. M., Wright, J. P., Bytchkov, A., Curfs, C., Gundlach, C., Orlova, M., ... Poulsen, H. F. (2010). The extension of ID11 for nanoscale and hierarchical characterization. Proceedings of the Risø International Symposium on Materials Science, 31, 457-476.