The electronic-structure origin of the anisotropic thermopower of nanolaminated Ti3SiC2 determined by polarized x-ray spectroscopy and Seebeck measurements

Martin Magnuson, Maurizio Mattesini, Ngo Van Nong, Per Eklund, Lars Hultman

Research output: Chapter in Book/Report/Conference proceedingConference abstract in proceedingsResearchpeer-review

Original languageEnglish
Title of host publicationProceedings - 37th International Conference and Expo on Advanced Ceramics and Composites (ICACC 2013)
Number of pages1
PublisherAmerican Ceramic Society
Publication date2013
Publication statusPublished - 2013
Event37th International Conference and Expo on Advanced Ceramics and Composites - Daytona Beach, FL, United States
Duration: 27 Jan 20131 Feb 2013
Conference number: 37
http://ceramics.org/meetings/37th-international-conference-and-expo-on-advanced-ceramics-and-composites

Conference

Conference37th International Conference and Expo on Advanced Ceramics and Composites
Number37
CountryUnited States
CityDaytona Beach, FL
Period27/01/201301/02/2013
Internet address

Cite this

Magnuson, M., Mattesini, M., Van Nong, N., Eklund, P., & Hultman, L. (2013). The electronic-structure origin of the anisotropic thermopower of nanolaminated Ti3SiC2 determined by polarized x-ray spectroscopy and Seebeck measurements. In Proceedings - 37th International Conference and Expo on Advanced Ceramics and Composites (ICACC 2013) American Ceramic Society.