The Effect of Vacuum Environment on Void Formation during HVEM Irradiation

Bachu Narain Singh, Torben Leffers, P. Brederoo (Editor), J. van Landuyt (Editor)

    Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearch

    Original languageEnglish
    Title of host publicationElectron Microscopy 1980: High Voltage : Proceedings of the 6. International Conference on High Voltage Electron Microscopy
    Volume4
    Place of PublicationLeiden
    PublisherElsevier
    Publication date1980
    Pages262-265
    ISBN (Print)0444861823
    Publication statusPublished - 1980
    Event6th International Conference on High Voltage Electron Microscopy - Antwerpen, Belgium
    Duration: 1 Sep 19803 Sep 1980
    Conference number: 6

    Conference

    Conference6th International Conference on High Voltage Electron Microscopy
    Number6
    CountryBelgium
    CityAntwerpen
    Period01/09/198003/09/1980

    Cite this

    Singh, B. N., Leffers, T., Brederoo, P. (Ed.), & van Landuyt, J. (Ed.) (1980). The Effect of Vacuum Environment on Void Formation during HVEM Irradiation. In Electron Microscopy 1980: High Voltage: Proceedings of the 6. International Conference on High Voltage Electron Microscopy (Vol. 4, pp. 262-265). Elsevier.