The Effect of Vacuum Environment on Void Formation during HVEM Irradiation

Bachu Narain Singh; Torben Leffers; P. Brederoo; J. van Landuyt

The Effect of Vacuum Environment on Void Formation during HVEM Irradiation

Bachu Narain Singh, Torben Leffers, P. Brederoo (Editor), J. van Landuyt (Editor)

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research

Original language	English
Title of host publication	Electron Microscopy 1980: High Voltage : Proceedings of the 6. International Conference on High Voltage Electron Microscopy
Volume	4
Place of Publication	Leiden
Publisher	Elsevier
Publication date	1980
Pages	262-265
ISBN (Print)	0444861823
Publication status	Published - 1980
Event	6th International Conference on High Voltage Electron Microscopy - Antwerpen, Belgium Duration: 1 Sept 1980 → 3 Sept 1980 Conference number: 6

Conference

Conference	6th International Conference on High Voltage Electron Microscopy
Number	6
Country/Territory	Belgium
City	Antwerpen
Period	01/09/1980 → 03/09/1980

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@inproceedings{6d3f5362adb14654bee3ff19f612eacd,

title = "The Effect of Vacuum Environment on Void Formation during HVEM Irradiation",

author = "Singh, {Bachu Narain} and Torben Leffers and P. Brederoo and {van Landuyt}, J.",

year = "1980",

language = "English",

isbn = "0444861823",

volume = "4",

pages = "262--265",

booktitle = "Electron Microscopy 1980: High Voltage",

publisher = "Elsevier",

address = "United Kingdom",

note = "6th International Conference on High Voltage Electron Microscopy ; Conference date: 01-09-1980 Through 03-09-1980",

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Singh, BN, Leffers, T, Brederoo, P (ed.) & van Landuyt, J (ed.) 1980, The Effect of Vacuum Environment on Void Formation during HVEM Irradiation. in Electron Microscopy 1980: High Voltage: Proceedings of the 6. International Conference on High Voltage Electron Microscopy. vol. 4, Elsevier, Leiden, pp. 262-265, 6th International Conference on High Voltage Electron Microscopy, Antwerpen, Belgium, 01/09/1980.

The Effect of Vacuum Environment on Void Formation during HVEM Irradiation. / Singh, Bachu Narain; Leffers, Torben; Brederoo, P. (Editor) et al.
Electron Microscopy 1980: High Voltage: Proceedings of the 6. International Conference on High Voltage Electron Microscopy. Vol. 4 Leiden: Elsevier, 1980. p. 262-265.

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research

TY - GEN

T1 - The Effect of Vacuum Environment on Void Formation during HVEM Irradiation

AU - Singh, Bachu Narain

AU - Leffers, Torben

A2 - Brederoo, P.

A2 - van Landuyt, J.

N1 - Conference code: 6

PY - 1980

Y1 - 1980

M3 - Article in proceedings

SN - 0444861823

VL - 4

SP - 262

EP - 265

BT - Electron Microscopy 1980: High Voltage

PB - Elsevier

CY - Leiden

T2 - 6th International Conference on High Voltage Electron Microscopy

Y2 - 1 September 1980 through 3 September 1980

ER -