The effect of scattered light sensor orientation on roughness measurement of curved polished surfaces

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Abstract

The effect of angular orientation of a scattered light sensor with respect to main curvature and surface lay on roughness measurements is evaluated. A commercial scattered light sensor OS 500-32 from Optosurf GmbH was used. The investigation was performed on polished cylindrical surfaces with crossed surface lay to document the robustness of the method. The instrument area-integrating measuring principle (figure 1) is based on a non-coherent light beam of ∅ 0.9 mm and 670 nm wavelength illuminating the measured surface, reflection of the incident light from the surface slopes in spatial directions, and its acquisition within ± 16º angular range with a linear detector array. From the distribution of the acquired scattered light intensity, a number of statistical parameters describing the surface texture are calculated, where the Aq parameter (variance of the scattered light distribution), is used to characterize the surface roughness.
Original languageEnglish
Publication date2014
Number of pages1
Publication statusPublished - 2014
Event14th International Conference of the European Society for Precision Engineering and Nanotechnology - Valamar Lacroma Hotel, Dubrovnik, Croatia
Duration: 2 Jun 20146 Jun 2014
Conference number: 14

Conference

Conference14th International Conference of the European Society for Precision Engineering and Nanotechnology
Number14
LocationValamar Lacroma Hotel
CountryCroatia
CityDubrovnik
Period02/06/201406/06/2014

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