The dynamic speckle-based wavemeter

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Abstract

Based on a previously devised speckle-based set-up for probing minute wavelength changes for a coherent field [1], [2] we will here present the first experiments where these changes are resolved on a millisecond time scale. The setup is based on probing the lateral shift of a speckle pattern arising from a slanted rough object, the speckle displacement being linearly proportional to the wavenumber change. Thus, by shearing the speckle pattern across a grating-like structure [3],[4] and [5], a frequency proportional to the frequency of the wavelength change can be derived as will the irradiance. Thus, a cordial display of the complex field amplitude may be obtained with a high temporal resolution and a reasonable spectral resolution. The spatial filter is here preliminarily implemented by recording the speckle pattern with a CMOS array with subsequent digital image processing mimicking the use of a spatial filter.
Original languageEnglish
Title of host publicationProceedings of SPIE
Number of pages6
Volume10834
PublisherSPIE - International Society for Optical Engineering
Publication date2018
Article number108342D
DOIs
Publication statusPublished - 2018
Event7th International Conference on Speckle Metrology - Bishop’s Castle in Janow Podlaski, Janow Podlaski, Poland
Duration: 10 Sep 201812 Sep 2018
http://convention.home.pl/autoinstalator/wordpress5/

Conference

Conference7th International Conference on Speckle Metrology
LocationBishop’s Castle in Janow Podlaski
CountryPoland
CityJanow Podlaski
Period10/09/201812/09/2018
Internet address
SeriesProceedings of S P I E - International Society for Optical Engineering
ISSN0277-786X

Keywords

  • Spectrometry
  • Speckle
  • Scattering

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