The best choice of reflection for measurements of bulk residual stresses as derived from self-consistent modelling

B. Clausen, T. Leffers

Research output: Chapter in Book/Report/Conference proceeding › Conference abstract in proceedings › Research

Original language	English
Title of host publication	Abstract booklet
Number of pages	30
Place of Publication	Hamburg
Publisher	DESY
Publication date	2003
Publication status	Published - 2003
Event	International Workshop on Hard Synchrotron X-Rays for Texture and Strain Analysis - Hamburg, Germany Duration: 9 Apr 2003 → 12 Apr 2003

Workshop	International Workshop on Hard Synchrotron X-Rays for Texture and Strain Analysis
Country/Territory	Germany
City	Hamburg
Period	09/04/2003 → 12/04/2003

OpenUrl availability

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title = "The best choice of reflection for measurements of bulk residual stresses as derived from self-consistent modelling",

keywords = "5-I nano",

author = "B. Clausen and T. Leffers",

year = "2003",

language = "English",

booktitle = "Abstract booklet",

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note = "International Workshop on Hard Synchrotron X-Rays for Texture and Strain Analysis ; Conference date: 09-04-2003 Through 12-04-2003",

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TY - ABST

T1 - The best choice of reflection for measurements of bulk residual stresses as derived from self-consistent modelling

AU - Clausen, B.

AU - Leffers, T.

PY - 2003

Y1 - 2003

KW - 5-I nano

M3 - Conference abstract in proceedings

BT - Abstract booklet

PB - DESY

CY - Hamburg

T2 - International Workshop on Hard Synchrotron X-Rays for Texture and Strain Analysis

Y2 - 9 April 2003 through 12 April 2003

ER -