The atomic structure of the Si(111) (2 root 3x2 root 3)R30 degrees-Sn reconstruction

A.H. Levermann; P.B. Howes; K.A. Edwards; H.T. Anyele; C.C. Matthai; J.E. Macdonald; R. Feidenhans'l; L. Lottermoser; L. Seehofer; G. Falkenberg; R.L. Johnson

doi:10.1016/S0169-4332(96)00132-8

The atomic structure of the Si(111) (2 root 3x2 root 3)R30 degrees-Sn reconstruction

A.H. Levermann, P.B. Howes, K.A. Edwards, H.T. Anyele, C.C. Matthai, J.E. Macdonald, R. Feidenhans'l, L. Lottermoser, L. Seehofer, G. Falkenberg, R.L. Johnson

Research output: Contribution to journal › Journal article › Research

Abstract

We have studied the atomic structure of the (2 root 3x2 root)R30 degrees reconstruction induced by adsorption of about 1.1 monolayers of Sn on Si(lll) using surface X-ray diffraction (SXRD) and scanning tunnelling microscopy (STM). The experimentally obtained structure factors in SXRD are in contradiction with existing models in the literature and we conclude the need for a new surface atomic structure model. We have been able to determine a number of properties of an appropriate surface model to allow a better fit to the experimental structure factors.

Original language	English
Journal	Applied Surface Science
Volume	104
Issue number	124-129
Pages (from-to)	124-129
ISSN	0169-4332
DOIs	https://doi.org/10.1016/S0169-4332(96)00132-8
Publication status	Published - 1996

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title = "The atomic structure of the Si(111) (2 root 3x2 root 3)R30 degrees-Sn reconstruction",

abstract = "We have studied the atomic structure of the (2 root 3x2 root)R30 degrees reconstruction induced by adsorption of about 1.1 monolayers of Sn on Si(lll) using surface X-ray diffraction (SXRD) and scanning tunnelling microscopy (STM). The experimentally obtained structure factors in SXRD are in contradiction with existing models in the literature and we conclude the need for a new surface atomic structure model. We have been able to determine a number of properties of an appropriate surface model to allow a better fit to the experimental structure factors. ",

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author = "A.H. Levermann and P.B. Howes and K.A. Edwards and H.T. Anyele and C.C. Matthai and J.E. Macdonald and R. Feidenhans'l and L. Lottermoser and L. Seehofer and G. Falkenberg and R.L. Johnson",

year = "1996",

doi = "10.1016/S0169-4332(96)00132-8",

language = "English",

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pages = "124--129",

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T1 - The atomic structure of the Si(111) (2 root 3x2 root 3)R30 degrees-Sn reconstruction

AU - Levermann, A.H.

AU - Howes, P.B.

AU - Edwards, K.A.

AU - Anyele, H.T.

AU - Matthai, C.C.

AU - Macdonald, J.E.

AU - Feidenhans'l, R.

AU - Lottermoser, L.

AU - Seehofer, L.

AU - Falkenberg, G.

AU - Johnson, R.L.

PY - 1996

Y1 - 1996

N2 - We have studied the atomic structure of the (2 root 3x2 root)R30 degrees reconstruction induced by adsorption of about 1.1 monolayers of Sn on Si(lll) using surface X-ray diffraction (SXRD) and scanning tunnelling microscopy (STM). The experimentally obtained structure factors in SXRD are in contradiction with existing models in the literature and we conclude the need for a new surface atomic structure model. We have been able to determine a number of properties of an appropriate surface model to allow a better fit to the experimental structure factors.

AB - We have studied the atomic structure of the (2 root 3x2 root)R30 degrees reconstruction induced by adsorption of about 1.1 monolayers of Sn on Si(lll) using surface X-ray diffraction (SXRD) and scanning tunnelling microscopy (STM). The experimentally obtained structure factors in SXRD are in contradiction with existing models in the literature and we conclude the need for a new surface atomic structure model. We have been able to determine a number of properties of an appropriate surface model to allow a better fit to the experimental structure factors.

KW - Nye funktionelle materialer

U2 - 10.1016/S0169-4332(96)00132-8

DO - 10.1016/S0169-4332(96)00132-8

M3 - Journal article

SN - 0169-4332

VL - 104

SP - 124

EP - 129

JO - Applied Surface Science

JF - Applied Surface Science

IS - 124-129

ER -

The atomic structure of the Si(111) (2 root 3x2 root 3)R30 degrees-Sn reconstruction

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