The Application of Off-Axis Electron Holography to Electrically Biased Single GaN Nanowires for Electrical Resistivity Measurement

Sadegh Yazdi; Takeshi Kasama; Marco Beleggia; R. Ciechonski; O. Kryliouk; Jakob Birkedal Wagner

doi:10.1017/S1431927613009501

The Application of Off-Axis Electron Holography to Electrically Biased Single GaN Nanowires for Electrical Resistivity Measurement

Sadegh Yazdi
, Takeshi Kasama
, Marco Beleggia
, R. Ciechonski
, O. Kryliouk
, Jakob Birkedal Wagner

Research output: Contribution to journal › Conference abstract in journal › Research › peer-review

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Original language	English
Journal	Microscopy and Microanalysis
Volume	19
Issue number	Supplement S2
Pages (from-to)	1502-1503
ISSN	1431-9276
DOIs	https://doi.org/10.1017/S1431927613009501
Publication status	Published - 2013
Event	Microscopy and Microanalysis 2013 - Indiana Convention Center, Indianapolis, United States Duration: 4 Aug 2013 → 8 Aug 2013 http://microscopy.org/mandm/2013/

Conference

Conference	Microscopy and Microanalysis 2013
Location	Indiana Convention Center
Country/Territory	United States
City	Indianapolis
Period	04/08/2013 → 08/08/2013
Internet address	http://microscopy.org/mandm/2013/

Access to Document

10.1017/S1431927613009501

S1431927613009501aFinal published version, 480 KB

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Cite this

@article{499adf6a9eca46688c5415cb79217bdf,

title = "The Application of Off-Axis Electron Holography to Electrically Biased Single GaN Nanowires for Electrical Resistivity Measurement",

author = "Sadegh Yazdi and Takeshi Kasama and Marco Beleggia and R. Ciechonski and O. Kryliouk and Wagner, \{Jakob Birkedal\}",

year = "2013",

doi = "10.1017/S1431927613009501",

language = "English",

volume = "19",

pages = "1502--1503",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

number = "Supplement S2",

note = "Microscopy and Microanalysis 2013, MandM ; Conference date: 04-08-2013 Through 08-08-2013",

url = "http://microscopy.org/mandm/2013/",

}

The Application of Off-Axis Electron Holography to Electrically Biased Single GaN Nanowires for Electrical Resistivity Measurement. / Yazdi, Sadegh; Kasama, Takeshi; Beleggia, Marco et al.
In: Microscopy and Microanalysis, Vol. 19, No. Supplement S2, 2013, p. 1502-1503.

Research output: Contribution to journal › Conference abstract in journal › Research › peer-review

TY - ABST

T1 - The Application of Off-Axis Electron Holography to Electrically Biased Single GaN Nanowires for Electrical Resistivity Measurement

AU - Yazdi, Sadegh

AU - Kasama, Takeshi

AU - Beleggia, Marco

AU - Ciechonski, R.

AU - Kryliouk, O.

AU - Wagner, Jakob Birkedal

PY - 2013

Y1 - 2013

U2 - 10.1017/S1431927613009501

DO - 10.1017/S1431927613009501

M3 - Conference abstract in journal

SN - 1431-9276

VL - 19

SP - 1502

EP - 1503

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - Supplement S2

T2 - Microscopy and Microanalysis 2013

Y2 - 4 August 2013 through 8 August 2013

ER -