The Application of Off-Axis Electron Holography to Electrically Biased Single GaN Nanowires for Electrical Resistivity Measurement

Sadegh Yazdi, Takeshi Kasama, Marco Beleggia, R. Ciechonski, O. Kryliouk, Jakob Birkedal Wagner

    Research output: Contribution to journalConference abstract in journalResearchpeer-review

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    Original languageEnglish
    JournalMicroscopy and Microanalysis
    Volume19
    Issue numberSupplement S2
    Pages (from-to)1502-1503
    ISSN1431-9276
    DOIs
    Publication statusPublished - 2013
    EventMicroscopy and Microanalysis 2013 - Indiana Convention Center, Indianapolis, United States
    Duration: 4 Aug 20138 Aug 2013
    http://microscopy.org/mandm/2013/

    Conference

    ConferenceMicroscopy and Microanalysis 2013
    LocationIndiana Convention Center
    Country/TerritoryUnited States
    CityIndianapolis
    Period04/08/201308/08/2013
    Internet address

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