Testing transition scattering in shaft digitisers

K.E. Neisig

doi:10.1049/el:19660188

Testing transition scattering in shaft digitisers

K.E. Neisig

Research output: Contribution to journal › Journal article › Research › peer-review

Abstract

The letter describes a method for testing transition errors in shaft digitisers. Although this type of error is normally accepted as being Gaussian-distributed, It may be of interest, for certain purposes, to know the shortest duration of outputs.

Original language	English
Journal	Electronics Letters
Volume	2
Issue number	6
Pages (from-to)	222
ISSN	0013-5194
DOIs	https://doi.org/10.1049/el:19660188
Publication status	Published - 1966

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title = "Testing transition scattering in shaft digitisers",

abstract = "The letter describes a method for testing transition errors in shaft digitisers. Although this type of error is normally accepted as being Gaussian-distributed, It may be of interest, for certain purposes, to know the shortest duration of outputs.",

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AU - Neisig, K.E.

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N2 - The letter describes a method for testing transition errors in shaft digitisers. Although this type of error is normally accepted as being Gaussian-distributed, It may be of interest, for certain purposes, to know the shortest duration of outputs.

AB - The letter describes a method for testing transition errors in shaft digitisers. Although this type of error is normally accepted as being Gaussian-distributed, It may be of interest, for certain purposes, to know the shortest duration of outputs.

U2 - 10.1049/el:19660188

DO - 10.1049/el:19660188

M3 - Journal article

SN - 0013-5194

VL - 2

SP - 222

JO - Electronics Letters

JF - Electronics Letters

IS - 6

ER -

Testing transition scattering in shaft digitisers

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