TY - JOUR
T1 - Test System Impact on System Availability
AU - Pau, L. F.
N1 - Copyright: 1987 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE
PY - 1987
Y1 - 1987
N2 - The specifications are presented for an imperfect automatic test system (ATS) (test frequency distribution, reliability, false alarm rate, nondetection rate) in order to account for the availability, readiness, mean time between unscheduled repairs (MTBUR), reliability, and maintenance of the system subject to monitoring and test. A time-dependent Markov model is presented, and applied in three cases, with examples of numerical results provided for preventive maintenance decisions, design of an automatic test system, buffer testing in computers, and data communications.
AB - The specifications are presented for an imperfect automatic test system (ATS) (test frequency distribution, reliability, false alarm rate, nondetection rate) in order to account for the availability, readiness, mean time between unscheduled repairs (MTBUR), reliability, and maintenance of the system subject to monitoring and test. A time-dependent Markov model is presented, and applied in three cases, with examples of numerical results provided for preventive maintenance decisions, design of an automatic test system, buffer testing in computers, and data communications.
U2 - 10.1109/TAES.1987.310856
DO - 10.1109/TAES.1987.310856
M3 - Journal article
SN - 0018-9251
VL - AES-23
SP - 625
EP - 633
JO - I E E E Transactions on Aerospace and Electronic Systems
JF - I E E E Transactions on Aerospace and Electronic Systems
IS - 5
ER -