Test System Impact on System Availability

L. F. Pau

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    Abstract

    The specifications are presented for an imperfect automatic test system (ATS) (test frequency distribution, reliability, false alarm rate, nondetection rate) in order to account for the availability, readiness, mean time between unscheduled repairs (MTBUR), reliability, and maintenance of the system subject to monitoring and test. A time-dependent Markov model is presented, and applied in three cases, with examples of numerical results provided for preventive maintenance decisions, design of an automatic test system, buffer testing in computers, and data communications.
    Original languageEnglish
    JournalI E E E Transactions on Aerospace and Electronic Systems
    VolumeAES-23
    Issue number5
    Pages (from-to)625-633
    ISSN0018-9251
    DOIs
    Publication statusPublished - 1987

    Bibliographical note

    Copyright: 1987 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE

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