Abstract
The so called ''test function'' is proposed for testing the electron distribution function as Maxwellian, bi-Maxwellian or different. A characteristic plasma potential might also be introduced and the ion plasma density can be calculated for Maxwellian or bi-Maxwellian by this test function around plasma potential.
| Original language | English |
|---|---|
| Title of host publication | Proceedings of the 1996 International Conference on Plasma Physics : Icpp 96 Contributed Papers |
| Number of pages | 4 |
| Volume | 1 & 2 |
| Publication date | 1997 |
| Pages | 1518-1521 |
| Publication status | Published - 1997 |
| Externally published | Yes |
| Event | 1996 International Conference on Plasma Physics - Nagoya, Japan Duration: 9 Sept 1996 → 13 Sept 1996 |
Conference
| Conference | 1996 International Conference on Plasma Physics |
|---|---|
| Country/Territory | Japan |
| City | Nagoya |
| Period | 09/09/1996 → 13/09/1996 |
Fingerprint
Dive into the research topics of 'Test-function for Langmuir probe characteristic'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver