Test-driven modeling of embedded systems

Allan Munck, Jan Madsen

Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

Abstract

To benefit maximally from model-based systems engineering (MBSE) trustworthy high quality models are required. From the software disciplines it is known that test-driven development (TDD) can significantly increase the quality of the products. Using a test-driven approach with MBSE may have a similar positive effect on the quality of the system models and the resulting products and may therefore be desirable. To define a test-driven model-based systems engineering (TD-MBSE) approach, we must define this approach for numerous sub disciplines such as modeling of requirements, use cases, scenarios, behavior, architecture, etc. In this paper we present a method that utilizes the formalism of timed automatons with formal and statistical model checking techniques to apply TD-MBSE to the modeling of system architecture and behavior. The results obtained from applying it to an industrial case suggest that our method provides a sound foundation for rapid development of high quality system models.
Original languageEnglish
Title of host publication1st IEEE Nordic Circuits and Systems Conference (NORCAS 2015) : NORCHIP & International Symposium on System-on-Chip (SoC)
Number of pages4
PublisherIEEE
Publication date2015
ISBN (Print)978-1-4673-6576-5
DOIs
Publication statusPublished - 2015
Event1st IEEE Nordic Circuits and Systems Conference (NORCAS 2015) - Oslo, Norway
Duration: 26 Oct 201528 Oct 2015
Conference number: 1
http://www.norcas.org/

Conference

Conference1st IEEE Nordic Circuits and Systems Conference (NORCAS 2015)
Number1
CountryNorway
CityOslo
Period26/10/201528/10/2015
OtherA merge of NORCHIP and the International Symposium on System-on-Chip (SoC)
Internet address

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