Terahertz Induced Electromigration

Andrew Strikwerda; Maksim Zalkovskij; Krzysztof Iwaszczuk; Peter Uhd Jepsen

Terahertz Induced Electromigration

Andrew Strikwerda, Maksim Zalkovskij, Krzysztof Iwaszczuk, Peter Uhd Jepsen

Research output: Contribution to conference › Poster › Research › peer-review

Abstract

We report the first observation of THz-field-induced electromigration in subwavelength metallic gap structures after exposure to intense single-cycle, sub-picosecond electric field transients of amplitude up to 400 kV/cm.

Original language	English
Publication date	2014
Number of pages	1
Publication status	Published - 2014
Event	19th International Conference on Ultrafast Phenomena 2014 - Okinawa Convention Center, Okinawa, Japan Duration: 7 Jul 2014 → 11 Jul 2014 Conference number: 19 http://up2014.org/

Conference

Conference	19th International Conference on Ultrafast Phenomena 2014
Number	19
Location	Okinawa Convention Center
Country/Territory	Japan
City	Okinawa
Period	07/07/2014 → 11/07/2014
Internet address	http://up2014.org/

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title = "Terahertz Induced Electromigration",

abstract = "We report the first observation of THz-field-induced electromigration in subwavelength metallic gap structures after exposure to intense single-cycle, sub-picosecond electric field transients of amplitude up to 400 kV/cm.",

author = "Andrew Strikwerda and Maksim Zalkovskij and Krzysztof Iwaszczuk and Jepsen, \{Peter Uhd\}",

year = "2014",

language = "English",

note = "19th International Conference on Ultrafast Phenomena 2014, UP 2014 ; Conference date: 07-07-2014 Through 11-07-2014",

url = "http://up2014.org/",

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TY - CONF

T1 - Terahertz Induced Electromigration

AU - Strikwerda, Andrew

AU - Zalkovskij, Maksim

AU - Iwaszczuk, Krzysztof

AU - Jepsen, Peter Uhd

N1 - Conference code: 19

PY - 2014

Y1 - 2014

N2 - We report the first observation of THz-field-induced electromigration in subwavelength metallic gap structures after exposure to intense single-cycle, sub-picosecond electric field transients of amplitude up to 400 kV/cm.

AB - We report the first observation of THz-field-induced electromigration in subwavelength metallic gap structures after exposure to intense single-cycle, sub-picosecond electric field transients of amplitude up to 400 kV/cm.

M3 - Poster

T2 - 19th International Conference on Ultrafast Phenomena 2014

Y2 - 7 July 2014 through 11 July 2014

ER -

Terahertz Induced Electromigration

Abstract

Conference

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