Terahertz Induced Electromigration

Andrew Strikwerda, Maksim Zalkovskij, Krzysztof Iwaszczuk, Peter Uhd Jepsen

    Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review

    Abstract

    We report the first observation of THz-field-induced electromigration in subwavelength metallic gap structures after exposure to intense single-cycle, sub-picosecond electric field transients of amplitude up to 400 kV/cm.
    Original languageEnglish
    Title of host publicationProceedings of the International Conference on Ultrafast Phenomena 2014
    PublisherOptical Society of America (OSA)
    Publication date2014
    Article number08.Tue.P2.42
    ISBN (Print)1-55752-279-0
    DOIs
    Publication statusPublished - 2014
    Event19th International Conference on Ultrafast Phenomena 2014 - Okinawa Convention Center, Okinawa, Japan
    Duration: 7 Jul 2014 → 11 Jul 2014
    Conference number: 19
    http://up2014.org/

    Conference

    Conference19th International Conference on Ultrafast Phenomena 2014
    Number19
    LocationOkinawa Convention Center
    Country/TerritoryJapan
    CityOkinawa
    Period07/07/2014 → 11/07/2014
    Internet address
    SeriesOSA Technical Digest

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