Terahertz Induced Electromigration

Andrew Strikwerda, Maksim Zalkovskij, Krzysztof Iwaszczuk, Peter Uhd Jepsen

Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

Abstract

We report the first observation of THz-field-induced electromigration in subwavelength metallic gap structures after exposure to intense single-cycle, sub-picosecond electric field transients of amplitude up to 400 kV/cm.
Original languageEnglish
Title of host publicationProceedings of the International Conference on Ultrafast Phenomena 2014
PublisherOptical Society of America OSA
Publication date2014
Article number08.Tue.P2.42
ISBN (Print)1-55752-279-0
DOIs
Publication statusPublished - 2014
Event19th International Conference on Ultrafast Phenomena 2014 - Okinawa Convention Center, Okinawa, Japan
Duration: 7 Jul 201411 Jul 2014
Conference number: 19
http://up2014.org/

Conference

Conference19th International Conference on Ultrafast Phenomena 2014
Number19
LocationOkinawa Convention Center
CountryJapan
CityOkinawa
Period07/07/201411/07/2014
Internet address
SeriesOSA Technical Digest

Cite this

Strikwerda, A., Zalkovskij, M., Iwaszczuk, K., & Jepsen, P. U. (2014). Terahertz Induced Electromigration. In Proceedings of the International Conference on Ultrafast Phenomena 2014 [08.Tue.P2.42] Optical Society of America OSA. OSA Technical Digest https://doi.org/10.1364/UP.2014.08.Tue.P2.42