Terahertz field induced electromigration

Andrew Strikwerda; Maksim Zalkovskij; Krzysztof Iwaszczuk; Peter Uhd Jepsen

Terahertz field induced electromigration

Andrew Strikwerda
, Maksim Zalkovskij
, Krzysztof Iwaszczuk
, Peter Uhd Jepsen

Research output: Contribution to conference › Conference abstract for conference › Research › peer-review

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Abstract

We report the first observation of THz-field-induced electromigration in sub-wavelength metallic gap structures after exposure to intense single-cycle, sub-picosecond electric field transients of amplitude up to 400 kV/cm.

Original language	English
Publication date	2014
Publication status	Published - 2014
Event	39th International Conference on Infrared, Millimeter, and Terahertz Waves - University of Arizona, Tucson, United States Duration: 14 Sept 2014 → 19 Sept 2014

Conference

Conference	39th International Conference on Infrared, Millimeter, and Terahertz Waves
Location	University of Arizona
Country/Territory	United States
City	Tucson
Period	14/09/2014 → 19/09/2014

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06956282 1 Final published version, 212 KB

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@conference{2a04d5aff6a843fe96973793749f106a,

title = "Terahertz field induced electromigration",

abstract = "We report the first observation of THz-field-induced electromigration in sub-wavelength metallic gap structures after exposure to intense single-cycle, sub-picosecond electric field transients of amplitude up to 400 kV/cm.",

author = "Andrew Strikwerda and Maksim Zalkovskij and Krzysztof Iwaszczuk and Jepsen, \{Peter Uhd\}",

year = "2014",

language = "English",

note = "39th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THZ 2014 ; Conference date: 14-09-2014 Through 19-09-2014",

}

TY - ABST

T1 - Terahertz field induced electromigration

AU - Strikwerda, Andrew

AU - Zalkovskij, Maksim

AU - Iwaszczuk, Krzysztof

AU - Jepsen, Peter Uhd

PY - 2014

Y1 - 2014

N2 - We report the first observation of THz-field-induced electromigration in sub-wavelength metallic gap structures after exposure to intense single-cycle, sub-picosecond electric field transients of amplitude up to 400 kV/cm.

AB - We report the first observation of THz-field-induced electromigration in sub-wavelength metallic gap structures after exposure to intense single-cycle, sub-picosecond electric field transients of amplitude up to 400 kV/cm.

M3 - Conference abstract for conference

T2 - 39th International Conference on Infrared, Millimeter, and Terahertz Waves

Y2 - 14 September 2014 through 19 September 2014

ER -

Terahertz field induced electromigration

Abstract

Conference

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