Terahertz field induced electromigration

Andrew Strikwerda, Maksim Zalkovskij, Krzysztof Iwaszczuk, Peter Uhd Jepsen

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Abstract

We report the first observation of THz-field-induced electromigration in sub-wavelength metallic gap structures after exposure to intense single-cycle, sub-picosecond electric field transients of amplitude up to 400 kV/cm.
Original languageEnglish
Publication date2014
Publication statusPublished - 2014
Event39th International Conference on Infrared, Millimeter, and Terahertz Waves - University of Arizona, Tucson, AZ, United States
Duration: 14 Sep 201419 Sep 2014

Conference

Conference39th International Conference on Infrared, Millimeter, and Terahertz Waves
LocationUniversity of Arizona
Country/TerritoryUnited States
CityTucson, AZ
Period14/09/201419/09/2014

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