TEM phase contrast images of reverse-biased p-n junctions: The effect of charged oxide layers

Marco Beleggia, PF Fazzini, PG Merli, G Pozzi

Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

Original languageEnglish
Title of host publicationProceedings of the 5th Multinational Congress on Electron Microscopy
Number of pages2
Publication date2001
Pages307-308
ISBN (Print)1-58949-003-7
Publication statusPublished - 2001
Externally publishedYes
Event5th Multinational Congress on Electron Microscopy - Lecce, Italy
Duration: 20 Sep 200125 Sep 2001
Conference number: 5

Conference

Conference5th Multinational Congress on Electron Microscopy
Number5
Country/TerritoryItaly
CityLecce
Period20/09/200125/09/2001

Keywords

  • MICROSCOPY
  • ELECTRON HOLOGRAPHY

Cite this