TEM phase contrast images of reverse-biased p-n junctions: The effect of charged oxide layers

Marco Beleggia, PF Fazzini, PG Merli, G Pozzi

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review

Original language	English
Title of host publication	Proceedings of the 5th Multinational Congress on Electron Microscopy
Number of pages	2
Publication date	2001
Pages	307-308
ISBN (Print)	1-58949-003-7
Publication status	Published - 2001
Externally published	Yes
Event	5th Multinational Congress on Electron Microscopy - Lecce, Italy Duration: 20 Sep 2001 → 25 Sep 2001 Conference number: 5

Conference	5th Multinational Congress on Electron Microscopy
Number	5
Country	Italy
City	Lecce
Period	20/09/2001 → 25/09/2001

Keywords

@inproceedings{29a63c6b95574abea69026625ff11d6a,

title = "TEM phase contrast images of reverse-biased p-n junctions: The effect of charged oxide layers",

keywords = "MICROSCOPY, ELECTRON HOLOGRAPHY",

author = "Marco Beleggia and PF Fazzini and PG Merli and G Pozzi",

year = "2001",

language = "English",

isbn = "1-58949-003-7",

pages = "307--308",

booktitle = "Proceedings of the 5th Multinational Congress on Electron Microscopy",

note = "5th Multinational Congress on Electron Microscopy ; Conference date: 20-09-2001 Through 25-09-2001",

}

TY - GEN

T1 - TEM phase contrast images of reverse-biased p-n junctions

T2 - 5th Multinational Congress on Electron Microscopy

AU - Beleggia, Marco

AU - Fazzini, PF

AU - Merli, PG

AU - Pozzi, G

N1 - Conference code: 5

PY - 2001

Y1 - 2001

KW - MICROSCOPY

KW - ELECTRON HOLOGRAPHY

M3 - Article in proceedings

SN - 1-58949-003-7

SP - 307

EP - 308

BT - Proceedings of the 5th Multinational Congress on Electron Microscopy

Y2 - 20 September 2001 through 25 September 2001

ER -