TEM characterization of surface and interface structures

Q.F. Xing

    Research output: Chapter in Book/Report/Conference proceedingConference abstract in proceedingsResearch

    Original languageEnglish
    Title of host publicationExtended abstracts
    EditorsJ.R. Bowen, A. Godfrey, W. Pantleon
    VolumeRisø-R-1347(EN)
    Publication date2002
    Pages67-68
    ISBN (Print)87-550-3072-6
    Publication statusPublished - 2002
    Event1st Joint Chinese-Danish Symposium: Characterisation of Microstructures - Qinhuangdao, China
    Duration: 19 Aug 200220 Aug 2002

    Conference

    Conference1st Joint Chinese-Danish Symposium
    CountryChina
    CityQinhuangdao
    Period19/08/200220/08/2002

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