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Tapping AFM measurements artefacts in the acquisition of high-aspect-ratio rectangular nanostructures using dedicated sharp tips
Dario Loaldi, Danilo Quagliotti, Matteo Calaon, Ilja Czolkos, Alicia Johansson, Theodor Nielsen, Jørgen Garnaes, Guido Tosello
Research output: Chapter in Book/Report/Conference proceeding › Conference abstract in proceedings › Research › peer-review
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