Tapping AFM measurements artefacts in the acquisition of high-aspect-ratio rectangular nanostructures using dedicated sharp tips

Dario Loaldi; Danilo Quagliotti; Matteo Calaon; Ilja  Czolkos; Alicia Johansson; Theodor Nielsen; Jørgen Garnaes; Guido Tosello

Tapping AFM measurements artefacts in the acquisition of high-aspect-ratio rectangular nanostructures using dedicated sharp tips

Dario Loaldi, Danilo Quagliotti, Matteo Calaon, Ilja Czolkos, Alicia Johansson, Theodor Nielsen, Jørgen Garnaes, Guido Tosello

Research output: Contribution to conference › Poster › Research › peer-review

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Original language	English
Publication date	2019
Publication status	Published - 2019
Event	19th International Conference of the european Society for Precision Engineering and Nanotechnology (euspen 19) - Bilbao, Spain Duration: 3 Jun 2019 → 7 Jun 2019

Conference

Conference	19th International Conference of the european Society for Precision Engineering and Nanotechnology (euspen 19)
Country/Territory	Spain
City	Bilbao
Period	03/06/2019 → 07/06/2019

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Poster euspen2019 TappingAFMArtefacts V3darloaFinal published version, 815 KB

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Loaldi, D., Quagliotti, D., Calaon, M., Czolkos, I., Johansson, A., Nielsen, T., Garnaes, J., & Tosello, G. (2019). Tapping AFM measurements artefacts in the acquisition of high-aspect-ratio rectangular nanostructures using dedicated sharp tips. 1. Poster session presented at 19th International Conference of the european Society for Precision Engineering and Nanotechnology (euspen 19), Bilbao, Spain.

@conference{380b2563c8114d8f8cfa957a38c1c568,

title = "Tapping AFM measurements artefacts in the acquisition of high-aspect-ratio rectangular nanostructures using dedicated sharp tips",

author = "Dario Loaldi and Danilo Quagliotti and Matteo Calaon and Ilja Czolkos and Alicia Johansson and Theodor Nielsen and J{\o}rgen Garnaes and Guido Tosello",

year = "2019",

language = "English",

pages = "1",

note = "19th International Conference of the european Society for Precision Engineering and Nanotechnology (euspen 19) ; Conference date: 03-06-2019 Through 07-06-2019",

}

Loaldi, D, Quagliotti, D , Calaon, M, Czolkos, I, Johansson, A, Nielsen, T, Garnaes, J & Tosello, G 2019, 'Tapping AFM measurements artefacts in the acquisition of high-aspect-ratio rectangular nanostructures using dedicated sharp tips', 19th International Conference of the european Society for Precision Engineering and Nanotechnology (euspen 19), Bilbao, Spain, 03/06/2019 - 07/06/2019 pp. 1.

Tapping AFM measurements artefacts in the acquisition of high-aspect-ratio rectangular nanostructures using dedicated sharp tips. / Loaldi, Dario; Quagliotti, Danilo ; Calaon, Matteo et al.
2019. 1 Poster session presented at 19th International Conference of the european Society for Precision Engineering and Nanotechnology (euspen 19), Bilbao, Spain.

Research output: Contribution to conference › Poster › Research › peer-review

TY - CONF

T1 - Tapping AFM measurements artefacts in the acquisition of high-aspect-ratio rectangular nanostructures using dedicated sharp tips

AU - Loaldi, Dario

AU - Quagliotti, Danilo

AU - Calaon, Matteo

AU - Czolkos, Ilja

AU - Johansson, Alicia

AU - Nielsen, Theodor

AU - Garnaes, Jørgen

AU - Tosello, Guido

PY - 2019

Y1 - 2019

M3 - Poster

SP - 1

T2 - 19th International Conference of the european Society for Precision Engineering and Nanotechnology (euspen 19)

Y2 - 3 June 2019 through 7 June 2019

ER -