Tapping AFM measurements artefacts in the acquisition of high-aspect-ratio rectangular nanostructures using dedicated sharp tips

Dario Loaldi, Danilo Quagliotti, Matteo Calaon, Ilja Czolkos, Alicia Johansson, Theodor Nielsen, Jørgen Garnaes, Guido Tosello

Research output: Contribution to conferencePosterResearchpeer-review

30 Downloads (Pure)
Original languageEnglish
Publication date2019
Publication statusPublished - 2019
Event19th International Conference of the european Society for Precision Engineering and Nanotechnology (euspen 19) - Bilbao, Spain
Duration: 3 Jun 20197 Jun 2019

Conference

Conference19th International Conference of the european Society for Precision Engineering and Nanotechnology (euspen 19)
Country/TerritorySpain
CityBilbao
Period03/06/201907/06/2019

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