Systematic Errors in Dimensional X-ray Computed Tomography

A result of a measurement is usually affected by a measurement error which cannot be avoided in practice. Particularly in production metrology, systematic errors from, e.g, temperature influences, drift effects, etc., may lead to high measurement deviation in respect to the true value of the measurement. As a consequence, there is a high risk that on the basis of defective measurement results, a manufactured product is wrongly rejected in conformance testing.
According to guidelines and standards, systematic error influences on a final measurand must be avoided or at least known so that it is possible to compensate them. In dimensional X-ray computed tomography (CT), many physical quantities influence the final result. However, it is important to know which factors in CT measurements potentially lead to systematic errors. In this talk, typical error sources in dimensional X-ray CT are discussed. Using practical examples, the speaker want to emphasis the importance of optimal scanning and evaluation strategies in CT metrology.