Abstract
We combine THz scattering-type scanning near-field optical microscopy (s-SNOM) and synthetic optical holography (SOH) to enable fast, amplitude and phase resolved THz nanoimaging using a THz gas laser and Schottky diode detector. We demonstrate our novel tool by imaging graphene grown via chemical vapor deposition (CVD) and other 2D materials.
Original language | English |
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Title of host publication | Proceedings of 2018 43rd International Conference on Infrared, Millimeter, and Terahertz Waves |
Number of pages | 1 |
Publisher | IEEE |
Publication date | 2018 |
Pages | 1-1 |
ISBN (Print) | 9781538638088 |
DOIs | |
Publication status | Published - 2018 |
Event | 43rd International Conference on Infrared, Millimeter, and Terahertz Waves - Nagoya Conference Center, Nagoya, Japan Duration: 9 Sep 2018 → 14 Sep 2018 Conference number: 43 http://www.irmmw-thz2018.org/ |
Conference
Conference | 43rd International Conference on Infrared, Millimeter, and Terahertz Waves |
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Number | 43 |
Location | Nagoya Conference Center |
Country/Territory | Japan |
City | Nagoya |
Period | 09/09/2018 → 14/09/2018 |
Sponsor | Advantest Corporation, AmTechs Corporation, Menlo Systems GmbH, Nippo Precigion Co., Ltd., TeraMetrix, LLC |
Internet address |
Keywords
- Graphene
- Holography
- Holographic optical components
- Optical imaging
- Optical reflection
- Optical scattering
- Grain boundaries