Synchrotron X-ray studies of liquid-vapor interfaces

Jens Aage Als-Nielsen

    Research output: Contribution to journalConference articlepeer-review

    Abstract

    The density profile ρ(z) across a liquid-vapor interface may be determined by the reflectivity R(θ) of X-rays at grazing angle incidence θ. The relation between R(θ) and ρ(z) is discussed, and experimental examples illustrating thermal roughness of simple liquids and smectic layering of liquid crystals are presented
    Original languageEnglish
    JournalPhysica A
    Volume140A
    Issue number1-2
    Pages (from-to)376-389
    ISSN0378-4371
    DOIs
    Publication statusPublished - 1986
    EventInternational Conference on Thermodynamics and Statistical Mechanics - Netherlands, Boston, MA
    Duration: 1 Jan 1986 → …
    Conference number: 16

    Conference

    ConferenceInternational Conference on Thermodynamics and Statistical Mechanics
    Number16
    CityNetherlands, Boston, MA
    Period01/01/1986 → …

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