Synchrotron X-ray studies of liquid-vapor interfaces

Jens Aage Als-Nielsen

doi:10.1016/0378-4371(86)90244-X

Synchrotron X-ray studies of liquid-vapor interfaces

Jens Aage Als-Nielsen

Research output: Contribution to journal › Conference article › Research › peer-review

Abstract

The density profile ρ(z) across a liquid-vapor interface may be determined by the reflectivity R(θ) of X-rays at grazing angle incidence θ. The relation between R(θ) and ρ(z) is discussed, and experimental examples illustrating thermal roughness of simple liquids and smectic layering of liquid crystals are presented

Original language	English
Journal	Physica A
Volume	140A
Issue number	1-2
Pages (from-to)	376-389
ISSN	0378-4371
DOIs	https://doi.org/10.1016/0378-4371(86)90244-X
Publication status	Published - 1986
Event	International Conference on Thermodynamics and Statistical Mechanics - Netherlands, Boston, MA Duration: 1 Jan 1986 → … Conference number: 16

Conference

Conference	International Conference on Thermodynamics and Statistical Mechanics
Number	16
City	Netherlands, Boston, MA
Period	01/01/1986 → …

Access to Document

10.1016/0378-4371(86)90244-X

OpenUrl availability

Full text

Cite this

@inproceedings{bef5dcd7dde54c85bf8344659ad0cd78,

title = "Synchrotron X-ray studies of liquid-vapor interfaces",

abstract = "The density profile ρ(z) across a liquid-vapor interface may be determined by the reflectivity R(θ) of X-rays at grazing angle incidence θ. The relation between R(θ) and ρ(z) is discussed, and experimental examples illustrating thermal roughness of simple liquids and smectic layering of liquid crystals are presented",

author = "Als-Nielsen, {Jens Aage}",

year = "1986",

doi = "10.1016/0378-4371(86)90244-X",

language = "English",

volume = "140A",

pages = "376--389",

journal = "Physica A",

issn = "0378-4371",

publisher = "Elsevier",

number = "1-2",

note = "International Conference on Thermodynamics and Statistical Mechanics ; Conference date: 01-01-1986",

}

TY - GEN

T1 - Synchrotron X-ray studies of liquid-vapor interfaces

AU - Als-Nielsen, Jens Aage

N1 - Conference code: 16

PY - 1986

Y1 - 1986

N2 - The density profile ρ(z) across a liquid-vapor interface may be determined by the reflectivity R(θ) of X-rays at grazing angle incidence θ. The relation between R(θ) and ρ(z) is discussed, and experimental examples illustrating thermal roughness of simple liquids and smectic layering of liquid crystals are presented

AB - The density profile ρ(z) across a liquid-vapor interface may be determined by the reflectivity R(θ) of X-rays at grazing angle incidence θ. The relation between R(θ) and ρ(z) is discussed, and experimental examples illustrating thermal roughness of simple liquids and smectic layering of liquid crystals are presented

U2 - 10.1016/0378-4371(86)90244-X

DO - 10.1016/0378-4371(86)90244-X

M3 - Conference article

SN - 0378-4371

VL - 140A

SP - 376

EP - 389

JO - Physica A

JF - Physica A

IS - 1-2

T2 - International Conference on Thermodynamics and Statistical Mechanics

Y2 - 1 January 1986

ER -

Synchrotron X-ray studies of liquid-vapor interfaces

Abstract

Conference

Access to Document

OpenUrl availability

Fingerprint

Cite this