Synchrotron x-ray diffraction using triple-axis spectrometry. Progress report for 1980

Jens Aage Als-Nielsen

Synchrotron x-ray diffraction using triple-axis spectrometry. Progress report for 1980

Jens Aage Als-Nielsen

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Abstract

High resolution X-ray diffraction studies of (i) monolayers of the noble gases Kr and Ar physiosorbed on graphite (ii) smectic A fluctuations in the nema.ic and the smectic A phases of liquid crystals are described. The apparatus used is a triple axis spectrometer situated at the storage ring DORIS at Hasylab, DESY, Hamburg. A monochromatic, well collimated beam is extracted from the synchrotron radiation spectrum by Bragg reflection from perfect Si or Ge crystals. The direction of the beam scattered from the sample is determined by Bragg reflection from a perfect Si or Ge analyzer crystal. High intensities even with resolution extending beyond the wavelength of visible light can be obtained.

Original language	English

Place of Publication	Roskilde, Denmark
Publisher	Risø National Laboratory
Number of pages	23
ISBN (Print)	87-550-0731-7
Publication status	Published - 1980

Series	Risø-M
Number	2268
ISSN	0418-6435

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Risø-M-2268

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AB - High resolution X-ray diffraction studies of (i) monolayers of the noble gases Kr and Ar physiosorbed on graphite (ii) smectic A fluctuations in the nema.ic and the smectic A phases of liquid crystals are described. The apparatus used is a triple axis spectrometer situated at the storage ring DORIS at Hasylab, DESY, Hamburg. A monochromatic, well collimated beam is extracted from the synchrotron radiation spectrum by Bragg reflection from perfect Si or Ge crystals. The direction of the beam scattered from the sample is determined by Bragg reflection from a perfect Si or Ge analyzer crystal. High intensities even with resolution extending beyond the wavelength of visible light can be obtained.

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Synchrotron x-ray diffraction using triple-axis spectrometry. Progress report for 1980

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