Surface topography analysis for dimensional quality control of replication at the micrometre scale

M. Balcon, F. Marinello, Guido Tosello, S. Carmignato, E. Savio

    Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

    Abstract

    Replication of geometrical features and surfaces are present at different production levels, from realization of moulds to final product. Geometrical features must be reproduced within specification limits, to ensure product functionality . In order to control the replication quality, mould and replica surfaces must be quantitatively analysed and compared. In the present work, reference simulated surfaces were considered and studied in order to evaluate the effectiveness and traceability of different analysis tools for replication quality control. Topographies were analysed simulating different surface mapping techniques, such as optical profilometry, scanning probe microscopy and scanning electron microscopy. Different strategies for surface analysis and comparison are proposed and discussed taking into account the instrument, the measuring range and the functionality of the surface.
    Original languageEnglish
    Title of host publication13th International Conference on Metrology and Properties of Engineering Surfaces
    Publication date2011
    Pages194-198
    Publication statusPublished - 2011
    Event13th International Conference on Metrology and Properties of Engineering Surfaces - Twickenham Stadium, Twickenham, United Kingdom
    Duration: 12 Apr 201115 Apr 2011
    Conference number: 13
    http://conferences.npl.co.uk/met_prop/

    Conference

    Conference13th International Conference on Metrology and Properties of Engineering Surfaces
    Number13
    LocationTwickenham Stadium
    Country/TerritoryUnited Kingdom
    CityTwickenham
    Period12/04/201115/04/2011
    Internet address

    Keywords

    • Quality
    • Replication
    • Surface
    • Micromanufacturing

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