Supersonic exciton gratings: coherent inter-polariton scattering in semiconductor microcavities

Dan Birkedal, Lyssenko Vadim, Jørn Märcher Hvam

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Abstract

We report on a coherent nonlinear phenomenon in a semiconductor microcavity (SMC), which has no parallel for QW excitons. When two different polariton modes of the SMC are impulsively excited they undergo normal mode oscillations (NMOs) with coherent energy exchange between the exciton and the cavity mode. In our experiment the two polaritons are excited with slightly different angles resulting in a travelling wave exciton grating. When a test polariton mode is excited it will scatter in the travelling grating producing amplitude modulation sidebands. This phenomenon produces a transient four-wave mixing (TFWM) signal, which is shifted in frequency from that of the test beam by the NMO frequency, in our case, in the THz range corresponding to a grating velocity = 1 /spl times/ 10/sup 7/ m/s, which is four orders of magnitude larger than the sound velocity. The sample under investigation is a GaAs/AlGaAs /spl lambda/ cavity with a single 25 nm GaAs QW at the center.
Original languageEnglish
Title of host publicationSummaries of Papers Presented at the Quantum Electronics and Laser Science Conference, 2002. QELS '02. Technical Digest.
PublisherIEEE
Publication date2002
Pages260-261
ISBN (Print)15-57-52707-5
DOIs
Publication statusPublished - 2002
Event2002 Quantum Electronics and Laser Science Conference - Long Beach, CA, United States
Duration: 19 May 200222 May 2002
http://www.opticsinfobase.org/search.cfm?meetingid=19&year=2002

Conference

Conference2002 Quantum Electronics and Laser Science Conference
CountryUnited States
CityLong Beach, CA
Period19/05/200222/05/2002
Internet address

Bibliographical note

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Cite this

Birkedal, D., Vadim, L., & Hvam, J. M. (2002). Supersonic exciton gratings: coherent inter-polariton scattering in semiconductor microcavities. In Summaries of Papers Presented at the Quantum Electronics and Laser Science Conference, 2002. QELS '02. Technical Digest. (pp. 260-261). IEEE. https://doi.org/10.1109/QELS.2002.1031395