Abstract
Super-resolution imaging device comprising at least a first and a second elongated coupling element, each having a first transverse dimension at a first end and a second transverse dimension at a second end and being adapted for guiding light between their respective first and second ends, each further comprising a dielectric center element and a metallic side-wall region, which surrounds the dielectric center element. The coupling elements are arranged in a matrix comprising a matrix material and the first ends of the coupling elements are located at or in a vicinity of the first side of the matrix and the second ends of the coupling elements are located at or in a vicinity of the second side of the matrix. The second transverse dimension is larger than the first transverse dimension. A microscope objective system and a microscope comprising the super-resolution imaging device are also claimed.
Original language | English |
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IPC | G01Q60/22 |
Patent number | WO2014079450 |
Filing date | 30/05/2014 |
Country/Territory | International Bureau of the World Intellectual Property Organization (WIPO) |
Priority date | 23/11/2012 |
Priority number | EP20120194049 |
Publication status | Published - 2014 |