Sub-wavelength imaging by depolarization in a reflection near-field optical microscope using an uncoated fiber probe

Steen Madsen, Sergey I. Bozhevolnyi, Jørn Märcher Hvam

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    Abstract

    We present a reflection scanning near-field optical microscope utilizing counter-directional light propagation in an uncoated fiber probe, cross-polarized detection and shear-force feedback. Topographical and near-field optical imaging with a scanning speed of up to 10 mu m/s and a lateral resolution better than 40 nm are demonstrated with a latex projection test sample. Determination of the optical resolution as well as correlation between topographical and near-field optical images are discussed. (C) 1998 Elsevier Science B.V.
    Original languageEnglish
    JournalOptics Communications
    Volume146
    Issue number1-6
    Pages (from-to)277-284
    ISSN0030-4018
    DOIs
    Publication statusPublished - 1998

    Keywords

    • Near-field optical microscopy
    • Shear-force microscopy
    • Subwavelength resolution

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