We present a reflection scanning near-field optical microscope utilizing counter-directional light propagation in an uncoated fiber probe, cross-polarized detection and shear-force feedback. Topographical and near-field optical imaging with a scanning speed of up to 10 mu m/s and a lateral resolution better than 40 nm are demonstrated with a latex projection test sample. Determination of the optical resolution as well as correlation between topographical and near-field optical images are discussed. (C) 1998 Elsevier Science B.V.
- Near-field optical microscopy
- Shear-force microscopy
- Subwavelength resolution
Madsen, S., Bozhevolnyi, S. I., & Hvam, J. M. (1998). Sub-wavelength imaging by depolarization in a reflection near-field optical microscope using an uncoated fiber probe. Optics Communications, 146(1-6), 277-284. https://doi.org/10.1016/S0030-4018(97)00501-4