Structure of thin film TiO2 grown by magnetron sputtering analyzed by ion, electron, and X-ray scattering

Katarzyna Agnieszka Janik, Brian Seger, M. B. Sillassen, Christian Danvad Damsgaard, Ib Chorkendorff, Jakob Birkedal Wagner

Research output: Contribution to conferenceConference abstract for conferenceResearchpeer-review

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Original languageEnglish
Publication date2014
Number of pages1
Publication statusPublished - 2014
EventEuropean Powder Diffraction Conference 2014 - Århus, Denmark
Duration: 15 Jun 201418 Jun 2014

Conference

ConferenceEuropean Powder Diffraction Conference 2014
CountryDenmark
CityÅrhus
Period15/06/201418/06/2014

Keywords

  • Titanium dioxide
  • Rutherford backscattering
  • Electron diffraction
  • X-ray diffraction
  • Grazing incidence X-ray diffraction

Cite this

Janik, K. A., Seger, B., B. Sillassen, M., Damsgaard, C. D., Chorkendorff, I., & Wagner, J. B. (2014). Structure of thin film TiO2 grown by magnetron sputtering analyzed by ion, electron, and X-ray scattering. Abstract from European Powder Diffraction Conference 2014, Århus, Denmark.