Structure of thin film TiO2 grown by magnetron sputtering analyzed by ion, electron, and X-ray scattering

Katarzyna Agnieszka Janik; Brian Seger; M. B. Sillassen; Christian Danvad Damsgaard; Ib Chorkendorff; Jakob Birkedal Wagner

Structure of thin film TiO₂ grown by magnetron sputtering analyzed by ion, electron, and X-ray scattering

Katarzyna Agnieszka Janik, Brian Seger, M. B. Sillassen, Christian Danvad Damsgaard, Ib Chorkendorff, Jakob Birkedal Wagner

Research output: Contribution to conference › Conference abstract for conference › Research › peer-review

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Original language	English
Publication date	2014
Number of pages	1
Publication status	Published - 2014
Event	European Powder Diffraction Conference 2014 - Århus, Denmark Duration: 15 Jun 2014 → 18 Jun 2014

Conference

Conference	European Powder Diffraction Conference 2014
Country	Denmark
City	Århus
Period	15/06/2014 → 18/06/2014

Keywords

Titanium dioxide
Rutherford backscattering
Electron diffraction
X-ray diffraction
Grazing incidence X-ray diffraction

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Structure of thin filmSubmitted manuscript, 21.6 KB

1 Participating in or organising workshops, courses, seminars etc.

European Powder Diffraction Conference 2014
Katarzyna Agnieszka Janik (Participant)
15 Jun 2014 → 18 Jun 2014
Activity: Attending an event › Participating in or organising workshops, courses, seminars etc.

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Cite this

@conference{688ff41209ab46e8857cb5fe39b7cbd6,

title = "Structure of thin film TiO2 grown by magnetron sputtering analyzed by ion, electron, and X-ray scattering",

keywords = "Titanium dioxide, Rutherford backscattering, Electron diffraction, X-ray diffraction, Grazing incidence X-ray diffraction ",

author = "Janik, {Katarzyna Agnieszka} and Brian Seger and {B. Sillassen}, M. and Damsgaard, {Christian Danvad} and Ib Chorkendorff and Wagner, {Jakob Birkedal}",

year = "2014",

language = "English",

note = "European Powder Diffraction Conference 2014, EPDIC 14 ; Conference date: 15-06-2014 Through 18-06-2014",

}

Structure of thin film TiO₂ grown by magnetron sputtering analyzed by ion, electron, and X-ray scattering. / Janik, Katarzyna Agnieszka; Seger, Brian; B. Sillassen, M.; Damsgaard, Christian Danvad ; Chorkendorff, Ib ; Wagner, Jakob Birkedal.

2014. Abstract from European Powder Diffraction Conference 2014, Århus, Denmark.

Research output: Contribution to conference › Conference abstract for conference › Research › peer-review

TY - ABST

T1 - Structure of thin film TiO2 grown by magnetron sputtering analyzed by ion, electron, and X-ray scattering

AU - Janik, Katarzyna Agnieszka

AU - Seger, Brian

AU - B. Sillassen, M.

AU - Damsgaard, Christian Danvad

AU - Chorkendorff, Ib

AU - Wagner, Jakob Birkedal

PY - 2014

Y1 - 2014

KW - Titanium dioxide

KW - Rutherford backscattering

KW - Electron diffraction

KW - X-ray diffraction

KW - Grazing incidence X-ray diffraction

M3 - Conference abstract for conference

T2 - European Powder Diffraction Conference 2014

Y2 - 15 June 2014 through 18 June 2014

ER -