Structure determination of the indium-induced Si(111)-(4x1) reconstruction by surface X-ray diffraction

O. Bunk; G. Falkenberg; J.H. Zeysing; L. Lottermoser; R.L. Johnson; M. Nielsen; F.B. Rasmussen; J. Baker; R. Feidenhans'l

doi:10.1103/PhysRevB.59.12228

Structure determination of the indium-induced Si(111)-(4x1) reconstruction by surface X-ray diffraction

O. Bunk, G. Falkenberg, J.H. Zeysing, L. Lottermoser, R.L. Johnson, M. Nielsen, F.B. Rasmussen, J. Baker, R. Feidenhans'l

Research output: Contribution to journal › Journal article › Research

Abstract

A detailed structural model for the indium-induced Si(111)-(4 x 1) surface reconstruction has been determined by analyzing an extensive set of x-ray-diffraction data recorded with monochromatic (h omega=9.1 keV) synchrotron radiation. The reconstruction is quasi-one-dimensional. The main features in the structure are chains of silicon atoms alternating with zigzag chains of indium atoms on top of an essentially unperturbed silicon lattice. The indium coverage corresponds to one monolayer. The structural model consistently explains all previously published experimental data.

Original language	English
Journal	Physical Review B
Volume	59
Issue number	19
Pages (from-to)	12228-12231
ISSN	2469-9950
DOIs	https://doi.org/10.1103/PhysRevB.59.12228
Publication status	Published - 1999

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title = "Structure determination of the indium-induced Si(111)-(4x1) reconstruction by surface X-ray diffraction",

abstract = "A detailed structural model for the indium-induced Si(111)-(4 x 1) surface reconstruction has been determined by analyzing an extensive set of x-ray-diffraction data recorded with monochromatic (h omega=9.1 keV) synchrotron radiation. The reconstruction is quasi-one-dimensional. The main features in the structure are chains of silicon atoms alternating with zigzag chains of indium atoms on top of an essentially unperturbed silicon lattice. The indium coverage corresponds to one monolayer. The structural model consistently explains all previously published experimental data.",

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author = "O. Bunk and G. Falkenberg and J.H. Zeysing and L. Lottermoser and R.L. Johnson and M. Nielsen and F.B. Rasmussen and J. Baker and R. Feidenhans'l",

year = "1999",

doi = "10.1103/PhysRevB.59.12228",

language = "English",

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journal = "Physical Review B",

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T1 - Structure determination of the indium-induced Si(111)-(4x1) reconstruction by surface X-ray diffraction

AU - Bunk, O.

AU - Falkenberg, G.

AU - Zeysing, J.H.

AU - Lottermoser, L.

AU - Johnson, R.L.

AU - Nielsen, M.

AU - Rasmussen, F.B.

AU - Baker, J.

AU - Feidenhans'l, R.

PY - 1999

Y1 - 1999

N2 - A detailed structural model for the indium-induced Si(111)-(4 x 1) surface reconstruction has been determined by analyzing an extensive set of x-ray-diffraction data recorded with monochromatic (h omega=9.1 keV) synchrotron radiation. The reconstruction is quasi-one-dimensional. The main features in the structure are chains of silicon atoms alternating with zigzag chains of indium atoms on top of an essentially unperturbed silicon lattice. The indium coverage corresponds to one monolayer. The structural model consistently explains all previously published experimental data.

AB - A detailed structural model for the indium-induced Si(111)-(4 x 1) surface reconstruction has been determined by analyzing an extensive set of x-ray-diffraction data recorded with monochromatic (h omega=9.1 keV) synchrotron radiation. The reconstruction is quasi-one-dimensional. The main features in the structure are chains of silicon atoms alternating with zigzag chains of indium atoms on top of an essentially unperturbed silicon lattice. The indium coverage corresponds to one monolayer. The structural model consistently explains all previously published experimental data.

KW - Nye funktionelle materialer

U2 - 10.1103/PhysRevB.59.12228

DO - 10.1103/PhysRevB.59.12228

M3 - Journal article

SN - 2469-9950

VL - 59

SP - 12228

EP - 12231

JO - Physical Review B

JF - Physical Review B

IS - 19

ER -

Structure determination of the indium-induced Si(111)-(4x1) reconstruction by surface X-ray diffraction

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