Structural properties and interactions of thin films at the air-liquid interface explored by synchrotron X-ray scattering

Research output: Chapter in Book/Report/Conference proceeding › Book chapter › Research › peer-review

Original language	English
Title of host publication	Novel methods to study interfacial layers
Editors	D. Möbius, R. Miller
Place of Publication	Amsterdam
Publisher	Elsevier
Publication date	2001
Pages	205-254
ISBN (Print)	0-444-50948-8
DOIs	https://doi.org/10.1016/S1383-7303(01)80028-4
Publication status	Published - 2001

Series	Studies in interface science, 11

Access to Document

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title = "Structural properties and interactions of thin films at the air-liquid interface explored by synchrotron X-ray scattering",

keywords = "Industrielle materialer",

author = "T.R. Jensen and K. Kj{\ae}r",

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Structural properties and interactions of thin films at the air-liquid interface explored by synchrotron X-ray scattering. / Jensen, T.R.; Kjær, K.
Novel methods to study interfacial layers. ed. / D. Möbius; R. Miller. Amsterdam: Elsevier, 2001. p. 205-254 (Studies in interface science, 11).

Research output: Chapter in Book/Report/Conference proceeding › Book chapter › Research › peer-review

TY - CHAP

T1 - Structural properties and interactions of thin films at the air-liquid interface explored by synchrotron X-ray scattering

AU - Jensen, T.R.

AU - Kjær, K.

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Y1 - 2001

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DO - 10.1016/S1383-7303(01)80028-4

M3 - Book chapter

SN - 0-444-50948-8

T3 - Studies in interface science, 11

SP - 205

EP - 254

BT - Novel methods to study interfacial layers

A2 - Möbius, D.

A2 - Miller, R.

PB - Elsevier

CY - Amsterdam

ER -