@inbook{a6e4959a2096467da4a07a77b51bb3db,
title = "Structural properties and interactions of thin films at the air-liquid interface explored by synchrotron X-ray scattering",
keywords = "Industrielle materialer",
author = "T.R. Jensen and K. Kj{\ae}r",
year = "2001",
doi = "10.1016/S1383-7303(01)80028-4",
language = "English",
isbn = "0-444-50948-8",
series = "Studies in interface science, 11",
pages = "205--254",
editor = "D. M{\"o}bius and R. Miller",
booktitle = "Novel methods to study interfacial layers",
publisher = "Elsevier",
address = "United Kingdom",
}