Structural properties and interactions of thin films at the air-liquid interface explored by synchrotron X-ray scattering

T.R. Jensen, K. Kjær

    Research output: Chapter in Book/Report/Conference proceedingBook chapterResearchpeer-review

    Original languageEnglish
    Title of host publicationNovel methods to study interfacial layers
    EditorsD. Möbius, R. Miller
    Place of PublicationAmsterdam
    Publication date2001
    ISBN (Print)0-444-50948-8
    Publication statusPublished - 2001
    SeriesStudies in interface science, 11

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