Structural instability and electrical properties in epitaxial Er2O3-stabilized Bi2O3 thin films

Research output: Contribution to journalJournal articleResearchpeer-review

Abstract

Bismuth oxide based materials exhibit the highest oxygen ion conductivities, making them of great interest for use in energy conversion devices such as solid oxide fuel cells. However, these materials exhibit chemical and thermal instabilities and understanding and their stabilization is an actively pursued research goal. In this study, we investigate the structural and electrical properties of erbium oxide stabilized bismuth oxide (Er0.4Bi1.6O3 − δ) as thin films. These are deposited by pulsed laser deposition onto several single crystal substrates (MgO, Al2O3 and SrTiO3). The films show new forms of instabilities, both upon aging treatments in air and even under conductivity measurements, with remarkable changes in the film composition and microstructure. © 2014 Published by Elsevier B.V.
Original languageEnglish
JournalSolid State Ionics
Volume266
Pages (from-to)13-18
ISSN0167-2738
DOIs
Publication statusPublished - 2014

Keywords

  • Bi2O3
  • Epitaxial thin films
  • Ionic conductivity
  • Pulsed laser deposition

Cite this

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title = "Structural instability and electrical properties in epitaxial Er2O3-stabilized Bi2O3 thin films",
abstract = "Bismuth oxide based materials exhibit the highest oxygen ion conductivities, making them of great interest for use in energy conversion devices such as solid oxide fuel cells. However, these materials exhibit chemical and thermal instabilities and understanding and their stabilization is an actively pursued research goal. In this study, we investigate the structural and electrical properties of erbium oxide stabilized bismuth oxide (Er0.4Bi1.6O3 − δ) as thin films. These are deposited by pulsed laser deposition onto several single crystal substrates (MgO, Al2O3 and SrTiO3). The films show new forms of instabilities, both upon aging treatments in air and even under conductivity measurements, with remarkable changes in the film composition and microstructure. {\circledC} 2014 Published by Elsevier B.V.",
keywords = "Bi2O3, Epitaxial thin films, Ionic conductivity, Pulsed laser deposition",
author = "Simone Sanna and Vincenzo Esposito and Graves, {Christopher R.} and Johan Hjelm and Andreasen, {Jens Wenzel} and Nini Pryds",
year = "2014",
doi = "10.1016/j.ssi.2014.08.004",
language = "English",
volume = "266",
pages = "13--18",
journal = "Solid State Ionics",
issn = "0167-2738",
publisher = "Elsevier",

}

TY - JOUR

T1 - Structural instability and electrical properties in epitaxial Er2O3-stabilized Bi2O3 thin films

AU - Sanna, Simone

AU - Esposito, Vincenzo

AU - Graves, Christopher R.

AU - Hjelm, Johan

AU - Andreasen, Jens Wenzel

AU - Pryds, Nini

PY - 2014

Y1 - 2014

N2 - Bismuth oxide based materials exhibit the highest oxygen ion conductivities, making them of great interest for use in energy conversion devices such as solid oxide fuel cells. However, these materials exhibit chemical and thermal instabilities and understanding and their stabilization is an actively pursued research goal. In this study, we investigate the structural and electrical properties of erbium oxide stabilized bismuth oxide (Er0.4Bi1.6O3 − δ) as thin films. These are deposited by pulsed laser deposition onto several single crystal substrates (MgO, Al2O3 and SrTiO3). The films show new forms of instabilities, both upon aging treatments in air and even under conductivity measurements, with remarkable changes in the film composition and microstructure. © 2014 Published by Elsevier B.V.

AB - Bismuth oxide based materials exhibit the highest oxygen ion conductivities, making them of great interest for use in energy conversion devices such as solid oxide fuel cells. However, these materials exhibit chemical and thermal instabilities and understanding and their stabilization is an actively pursued research goal. In this study, we investigate the structural and electrical properties of erbium oxide stabilized bismuth oxide (Er0.4Bi1.6O3 − δ) as thin films. These are deposited by pulsed laser deposition onto several single crystal substrates (MgO, Al2O3 and SrTiO3). The films show new forms of instabilities, both upon aging treatments in air and even under conductivity measurements, with remarkable changes in the film composition and microstructure. © 2014 Published by Elsevier B.V.

KW - Bi2O3

KW - Epitaxial thin films

KW - Ionic conductivity

KW - Pulsed laser deposition

U2 - 10.1016/j.ssi.2014.08.004

DO - 10.1016/j.ssi.2014.08.004

M3 - Journal article

VL - 266

SP - 13

EP - 18

JO - Solid State Ionics

JF - Solid State Ionics

SN - 0167-2738

ER -