Strain relaxation in thin films of Cu grown on Ni(001)

F.B. Rasmussen; J. Baker; M. Nielsen; R. Feidenhans'l; R.L. Johnson

doi:10.1016/S0921-4526(98)00199-9

Strain relaxation in thin films of Cu grown on Ni(001)

F.B. Rasmussen, J. Baker, M. Nielsen, R. Feidenhans'l, R.L. Johnson

Research output: Contribution to journal › Conference article › Research › peer-review

Abstract

Surface X-ray diffraction and kinematical model calculations are used to determine the strain relaxation of embedded wedges with internal (111) facets formed in thin Cu films when grown on Ni(001). We show the wedges to be inhomogenously strained with a large lateral relaxation near the Cu/Ni interface which decays rapidly away from the interface. (C) 1998 Elsevier Science B.V. All rights reserved.

Original language	English
Journal	Physica B: Condensed Matter
Volume	248
Pages (from-to)	34-38
ISSN	0921-4526
DOIs	https://doi.org/10.1016/S0921-4526(98)00199-9
Publication status	Published - 1998
Event	5th International Conference on Surface X-ray and Neutron Scattering - Oxford, United Kingdom Duration: 13 Jul 1997 → 17 Jul 1997 Conference number: 5 http://www.sxns12.com/history.php

Conference

Conference	5th International Conference on Surface X-ray and Neutron Scattering
Number	5
Country/Territory	United Kingdom
City	Oxford
Period	13/07/1997 → 17/07/1997
Internet address	http://www.sxns12.com/history.php

Keywords

Strain relaxation
Nanoclusters
X-ray diffraction

Access to Document

10.1016/S0921-4526(98)00199-9

OpenUrl availability

Full text

Cite this

@inproceedings{44eac824a9934d6fb0c098a38d0b0d77,

title = "Strain relaxation in thin films of Cu grown on Ni(001)",

abstract = "Surface X-ray diffraction and kinematical model calculations are used to determine the strain relaxation of embedded wedges with internal (111) facets formed in thin Cu films when grown on Ni(001). We show the wedges to be inhomogenously strained with a large lateral relaxation near the Cu/Ni interface which decays rapidly away from the interface. (C) 1998 Elsevier Science B.V. All rights reserved.",

keywords = "Nye funktionelle materialer, Strain relaxation, Nanoclusters, X-ray diffraction",

author = "F.B. Rasmussen and J. Baker and M. Nielsen and R. Feidenhans'l and R.L. Johnson",

year = "1998",

doi = "10.1016/S0921-4526(98)00199-9",

language = "English",

volume = "248",

pages = "34--38",

journal = "Physica B: Condensed Matter",

issn = "0921-4526",

publisher = "Elsevier",

note = "5th International Conference on Surface X-ray and Neutron Scattering, SXNS5 ; Conference date: 13-07-1997 Through 17-07-1997",

url = "http://www.sxns12.com/history.php",

}

TY - GEN

T1 - Strain relaxation in thin films of Cu grown on Ni(001)

AU - Rasmussen, F.B.

AU - Baker, J.

AU - Nielsen, M.

AU - Feidenhans'l, R.

AU - Johnson, R.L.

N1 - Conference code: 5

PY - 1998

Y1 - 1998

N2 - Surface X-ray diffraction and kinematical model calculations are used to determine the strain relaxation of embedded wedges with internal (111) facets formed in thin Cu films when grown on Ni(001). We show the wedges to be inhomogenously strained with a large lateral relaxation near the Cu/Ni interface which decays rapidly away from the interface. (C) 1998 Elsevier Science B.V. All rights reserved.

AB - Surface X-ray diffraction and kinematical model calculations are used to determine the strain relaxation of embedded wedges with internal (111) facets formed in thin Cu films when grown on Ni(001). We show the wedges to be inhomogenously strained with a large lateral relaxation near the Cu/Ni interface which decays rapidly away from the interface. (C) 1998 Elsevier Science B.V. All rights reserved.

KW - Nye funktionelle materialer

KW - Strain relaxation

KW - Nanoclusters

KW - X-ray diffraction

U2 - 10.1016/S0921-4526(98)00199-9

DO - 10.1016/S0921-4526(98)00199-9

M3 - Conference article

SN - 0921-4526

VL - 248

SP - 34

EP - 38

JO - Physica B: Condensed Matter

JF - Physica B: Condensed Matter

T2 - 5th International Conference on Surface X-ray and Neutron Scattering

Y2 - 13 July 1997 through 17 July 1997

ER -

Strain relaxation in thin films of Cu grown on Ni(001)

Abstract

Conference

Keywords

Access to Document

OpenUrl availability

Fingerprint

Cite this