Strain profiling in thin films by synchrotron radiation - a novel technique

N.B. Thomsen, U. Lienert, S. Garbe, V. Honkimäki, H.F. Poulsen, A. Horsewell

Research output: Contribution to conference › Conference abstract for conference › Research

Original language	English
Publication date	1997
Publication status	Published - 1997
Event	International Conference on Advanced Materials - Strasbourg, France Duration: 16 Jun 1997 → 20 Jun 1997

Conference	International Conference on Advanced Materials
Country/Territory	France
City	Strasbourg
Period	16/06/1997 → 20/06/1997

OpenUrl availability

@conference{e3ce762b970747de96568b24b3807d45,

title = "Strain profiling in thin films by synchrotron radiation - a novel technique",

keywords = "Industrielle materialer",

author = "N.B. Thomsen and U. Lienert and S. Garbe and V. Honkim{\"a}ki and H.F. Poulsen and A. Horsewell",

year = "1997",

language = "English",

note = "International Conference on Advanced Materials , ICAM'97 ; Conference date: 16-06-1997 Through 20-06-1997",

}

TY - ABST

T1 - Strain profiling in thin films by synchrotron radiation - a novel technique

AU - Thomsen, N.B.

AU - Lienert, U.

AU - Garbe, S.

AU - Honkimäki, V.

AU - Poulsen, H.F.

AU - Horsewell, A.

PY - 1997

Y1 - 1997

KW - Industrielle materialer

M3 - Conference abstract for conference

T2 - International Conference on Advanced Materials

Y2 - 16 June 1997 through 20 June 1997

ER -