Strain profiling in thin films by synchrotron radiation - a novel technique

N.B. Thomsen, U. Lienert, S. Garbe, V. Honkimäki, H.F. Poulsen, A. Horsewell

    Research output: Contribution to conferenceConference abstract for conferenceResearch

    Original languageEnglish
    Publication date1997
    Publication statusPublished - 1997
    EventInternational Conference on Advanced Materials - Strasbourg, France
    Duration: 16 Jun 199720 Jun 1997

    Conference

    ConferenceInternational Conference on Advanced Materials
    CountryFrance
    CityStrasbourg
    Period16/06/199720/06/1997

    Cite this

    Thomsen, N. B., Lienert, U., Garbe, S., Honkimäki, V., Poulsen, H. F., & Horsewell, A. (1997). Strain profiling in thin films by synchrotron radiation - a novel technique. Abstract from International Conference on Advanced Materials , Strasbourg, France.