Strain mapping inside an individual processed vertical nanowire transistor using scanning X-ray nanodiffraction

Dmitry Dzhigaev*, Johannes Svensson, Abinaya Krishnaraja, Zhongyunshen Zhu, Zhe Ren, Yi-Lin Liu, Sebastian Kalbfleisch, Alexander Björling, Filip Lenrick, Zoltan Imre Balogh, Susanna Hammarberg, Jesper Wallentin, Rainer Timm, Lars-Erik Wernersson, Anders Mikkelsen

*Corresponding author for this work

Research output: Contribution to journalJournal articleResearchpeer-review

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Engineering

Material Science