Abstract
Structural and resistive anisotropy has been studied for the Bi0.4Ca0.6MnO3 films grown on (011)-oriented SrTiO3 substrates. Strong anisotropic transport behaviors are observed when significant lattice strains exist. The ratio of the two resistivities along the a and c axes of the films can be tuned between ∼1 and ∼13 by adjusting the a/c ratio between ∼1.01 and ∼1.04, which can be conducted simply by decreasing film thickness from 100 to 10 nm. Considerable anisotropy emerges and develops when film thickness drops below ∼60 nm. With the decrease in film thickness, a change in preferred growth direction of the films is also observed. These features of the lattice effects could be useful for the design of artificial materials and devices. © 2008 American Institute of Physics.
Original language | English |
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Article number | 113913 |
Journal | Journal of Applied Physics |
Volume | 104 |
Number of pages | 4 |
ISSN | 0021-8979 |
DOIs | |
Publication status | Published - 2008 |
Externally published | Yes |