Status of the Ir and Ir/SiC coating development for the Athena optics

Sara Svendsen, Desiree D. M. Ferreira, Sonny Massahi, Atefeh Jafari, Nis C. Gellert, Finn E. Christensen, Peter L. Henriksen, Lan M. Vu, Arne S. Jegers, Brian Shortt, Boris Landgraf, David A. Girou, Maximillien J. Collon, Levent Cibik, Evelyn Handick, Michael Krumrey

Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

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Abstract

The mirror coatings for the Athena X-ray telescope assumes Ir/SiC bilayer thin films as a baseline design. Adding the soft overcoat to the Ir X-ray mirror coatings for the Athena optics is used to improve the low energy performance necessary to achieve the telescope effective area requirements. The Athena mirror is based on silicon pore optics technology, for which the manufacturing process involves a sequence of wet chemical and thermal post-coating treatments of the mirror plates. Establishing compatibility of the thin film material candidates following exposure to these processes is critical for the Athena mission since the specific coating quality will influence the performance of the X-ray telescope. We present an investigation of Ir and Ir/SiC thin films exposed to post-coating treatments based on coatings produced at DTU Space. The current status of the chemical procedures is presented with representative coatings from the Athena-dedicated coating facility.
Original languageEnglish
Title of host publicationSpace Telescopes and Instrumentation 2020: Ultraviolet to Gamma Ray
EditorsJan-Willem A. den Herder, Shouleh Nikzad, Kazuhiro Nakazawa
Number of pages17
Volume11444
PublisherSPIE - International Society for Optical Engineering
Publication date2020
Article number114444K
DOIs
Publication statusPublished - 2020
EventSpace Telescopes and Instrumentation 2020: Ultraviolet to Gamma Ray - Online event
Duration: 14 Dec 202018 Dec 2020

Conference

ConferenceSpace Telescopes and Instrumentation 2020: Ultraviolet to Gamma Ray
LocationOnline event
Period14/12/202018/12/2020
SeriesProceedings of SPIE, the International Society for Optical Engineering
ISSN0277-786X

Keywords

  • Athena
  • X-ray optics
  • Thin film
  • Iridium
  • Silicon carbide
  • Silicon pore optics

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