Statistical Modeling of On-Time Delivery of Semiconductors Encompassing Variability of Yield and Cycle Time

Eric C. Maass, John W. Fowler, Murat Kulahci

Research output: Contribution to journal › Journal article › Research › peer-review

Original language	English
Journal	IEEE Transactions on Semiconductor Manufacturing
ISSN	0894-6507
Publication status	Submitted - 2008

Cite this

@article{94b7c58f18c44b1197a052272929574b,

title = "Statistical Modeling of On-Time Delivery of Semiconductors Encompassing Variability of Yield and Cycle Time",

author = "Maass, {Eric C.} and Fowler, {John W.} and Murat Kulahci",

year = "2008",

language = "English",

journal = "IEEE Transactions on Semiconductor Manufacturing",

issn = "0894-6507",

publisher = "Institute of Electrical and Electronics Engineers",

}