Stacked depth graded multilayer for hard X-ray, measured up to 130 keV

Carsten P. Cooper-Jensen, Finn Erland Christensen, S. Romaine, R. Bruni, Z. Zhong

Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

Original languageEnglish
Title of host publicationOptics for EUV, X-Ray, and Gamma-Ray Astronomy
Volume6688
Publication date2007
Publication statusPublished - 2007
EventOptics for EUV, X-Ray, and Gamma-Ray Astronomy III - San Diego, CA, United States
Duration: 29 Aug 200730 Aug 2007

Conference

ConferenceOptics for EUV, X-Ray, and Gamma-Ray Astronomy III
Country/TerritoryUnited States
CitySan Diego, CA
Period29/08/200730/08/2007

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