Stacked depth graded multilayer for hard X-ray, measured up to 130 keV

Carsten P. Cooper-Jensen, Finn Erland Christensen, S. Romaine, R. Bruni, Z. Zhong

    Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

    Original languageEnglish
    Title of host publicationOptics for EUV, X-Ray, and Gamma-Ray Astronomy
    Volume6688
    Publication date2007
    Publication statusPublished - 2007
    EventOptics for EUV, X-Ray, and Gamma-Ray Astronomy III - San Diego, CA, United States
    Duration: 29 Aug 200730 Aug 2007

    Conference

    ConferenceOptics for EUV, X-Ray, and Gamma-Ray Astronomy III
    Country/TerritoryUnited States
    CitySan Diego, CA
    Period29/08/200730/08/2007

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