Spectral correction algorithm for multispectral CdTe x-ray detectors

Erik D. Christensen, Jan Kehres, Yun Gu, Robert Feidenhans’l, Ulrik Lund Olsen

Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

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Abstract

Compared to the dual energy scintillator detectors widely used today, pixelated multispectral X-ray detectors show the potential to improve material identification in various radiography and tomography applications used for industrial and security purposes. However, detector effects, such as charge sharing and photon pileup, distort the measured spectra in high flux pixelated multispectral detectors. These effects significantly reduce the detectors’ capabilities to be used for material identification, which requires accurate spectral measurements. We have developed a semi analytical computational algorithm for multispectral CdTe X-ray detectors which corrects the measured spectra for severe spectral distortions caused by the detector. The algorithm is developed for the Multix ME100 CdTe X-ray detector, but could potentially be adapted for any pixelated multispectral CdTe detector. The calibration of the algorithm is based on simple attenuation measurements of commercially avaiable materials using standard laboratory sources, making the algorithm applicable in any X-ray setup. The validation of the algorithm has been done using experimental data acquired with both standard lab equipment and synchrotron radiation. The experiments show that the algorithm is fast, reliable even at X-ray flux up to 5 Mph/s/mm2, and greatly improves the accuracy of the measured X-ray spectra, making the algorithm very useful for both security and industrial applications where multispectral detectors are used.
Original languageEnglish
Title of host publicationProc. SPIE 10403, Infrared Remote Sensing and Instrumentation XXV
Number of pages15
Volume10391
PublisherSPIE - International Society for Optical Engineering
Publication date2017
Article number103930H
DOIs
Publication statusPublished - 2017
EventSPIE Optics + Photonics 2017 - San Diego, United States
Duration: 6 Aug 201710 Aug 2017
http://spie.org/conferences-and-exhibitions/past-conferences-and-exhibitions/optics-and-photonics-2017

Conference

ConferenceSPIE Optics + Photonics 2017
Country/TerritoryUnited States
CitySan Diego
Period06/08/201710/08/2017
Internet address
SeriesProceedings of SPIE, the International Society for Optical Engineering
ISSN0277-786X

Keywords

  • Multispectral CdTe detectors
  • Compensation of spectral distortions
  • Photon-counting
  • Multix ME100
  • Pulse pileup correction
  • Charge sharing correction

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