Speckle-based wavemeter

Steen Grüner Hanson, Michael Linde Jakobsen, Maumita Chakrabarti

    Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

    Abstract

    A spectrometer based on the application of dynamic speckles will be disclosed. The method relies on scattering of primarily coherent radiation from a slanted rough surface. The scattered radiation is collected on a detector array and the speckle displacement is monitored during a change in the incident wavelength. The change of wavelength gives an almost linear phaseshift across the scattering surface resulting in an almost linear shift of the speckle pattern, which is subsequently monitored. It is argued that frequency changes close to 100 MHz can be probed using a common CMOS array. Experiments showing agreement with theoretical predictions will be given. An extension of the method, with which fast wavelength changes in the GHz regime can be probed, will be discussed but not experimentally verified. This method relies on shearing the dynamic speckle pattern across a cylindrical lens array as it’s well-known within spatial filtering velocimetry.
    Original languageEnglish
    Title of host publicationProceedings of SPIE
    EditorsFernando Mendoza Santoyo
    Number of pages8
    PublisherSPIE - International Society for Optical Engineering
    Publication date2015
    Article number96600U
    DOIs
    Publication statusPublished - 2015
    EventSPECKLE 2015: VI International Conference on Speckle Metrology - Guanajuato, Mexico
    Duration: 24 Aug 201526 Aug 2015

    Conference

    ConferenceSPECKLE 2015
    Country/TerritoryMexico
    CityGuanajuato
    Period24/08/201526/08/2015

    Keywords

    • Spectrometry
    • Speckle
    • Scattering

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